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《Infrared and Laser Engineering》 2011-10
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Influence of interface layer on antireflection coating for laser optics

Ji Yiqin1,2,Liu Huasong2,Wang Zhanshan3,Chen Deying1,Fan Rongwei1, Jiang Yugang2,Hong Wei2,Liu Dandan2,Wu Zhinxin2,Wang Ri2(1.National Key Labratory of Science and Technology on Tunable Laser,Harbin Insitute of Technology,Harbin 150001,China; 2.Tianjin Key Laboratory of Optical Thin Film,Tianjin 300192,China; 3.Institute of Precision Optical Engineering,Tongji University,Shanghai 200092,China)  
With the development of laser technology,there is a requirement of the antireflection coating with ultra-high transmittance.It is crucial to consider the influence of the surface characteristics of substrates during the design,manufacture of high precision antireflection coating.In this paper,the substrate was fused silica and Ta2O5 and SiO2 were selected as high index and low index materials respectively.The 532 nm laser antireflection coating at normal incidence was designed,and the electric field distribution was calculated,while the surface roughness was considered as a mixed layer of geometric proportion volume.Then,the ideal V-type antireflection coating with interface layers of different thickness was calculated,and the numerical function relationship between the transmittance and the interface roughness was founded.At last the ideal design was optimized by numerical method,and the thin film structures with interface layer were gained.Research result is helpful to designing and preparing for the antireflection coating at short wavelength with ultra high transmittance.
【Fund】: 天津市科委项目(10JCYBJC01500)
【CateGory Index】: O484.41
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【Citations】
Chinese Journal Full-text Database 4 Hits
1 Lin Yongchang, Ln Weiqang, Sun Xiaomo;A High-quality Anti-reflection Coating at 6328[J];Journal of Beijing Institute of Technology;1985-01
2 JI Yi-qin,LIU Hua-song,ZHANG Yan-min(Tianjin Jinhang Institute of Technology Physics,Tianjin 300192,China);Test and analysis of optical film constants[J];Infrared and Laser Engineering;2006-05
3 JI Yi-qin1,CUI Yu-ping2,LIU Hua-song1,ZONG Jie1,SONG Hong-jun1,HONG Wei1,JIANG Fu-hao2,SUN Chi-quan3 (1.Tianjin Jinhang Institute of Technical Physics,Tianjin 300192,China; 2.Beijing Automation Control Equipment Institute,Beijing 100074,China;3.Representative Office in Tianjin of Military Representatives Bureau of NED in Tianjin,Tianjin 300192,China);Test and analysis of optics thin film loss[J];Infrared and Laser Engineering;2008-03
4 WANG Li1,2,CHENG Xin-bin1,WANG Zhan-shan1,TANG Qi3,FAN Bin3,(1.Institute of Precision Optical Engineering,Department of Physics,Tongji University,Shanghai 201804,China ;2.School of Media and Communications Technology,Liaocheng University,Liaocheng 252059,China;3.Optorun Co.Ltd.Kawagoe Shi,Saitama 350-0801,Japan);Influence of fitting data number on measurement of reflection based on cavity ring-down[J];Infrared and Laser Engineering;2008-05
【Co-citations】
Chinese Journal Full-text Database 4 Hits
1 WANG Li1,CHENG Xin-bin1,WANG Zhan-shan1,TANG Qi2,FAN Bin2(1.Institute of Precision Optical Engineering,Department of Physics,Tongji University,Shanghai 200092,China;2.Optorun Co,Ltd,Saitama 350-0801,Japan);IAD process for optical coating application[J];Infrared and Laser Engineering;2007-06
2 JI Yi-qin1,CUI Yu-ping2,LIU Hua-song1,ZONG Jie1,SONG Hong-jun1,HONG Wei1,JIANG Fu-hao2,SUN Chi-quan3 (1.Tianjin Jinhang Institute of Technical Physics,Tianjin 300192,China; 2.Beijing Automation Control Equipment Institute,Beijing 100074,China;3.Representative Office in Tianjin of Military Representatives Bureau of NED in Tianjin,Tianjin 300192,China);Test and analysis of optics thin film loss[J];Infrared and Laser Engineering;2008-03
3 FU Xiu-hua,SUN Yu-lin, HE Cai-mei, DONG Jie-ling (School of Opto-electronic Engineering, Changchun University of Science and Technology, Changchun 130022, China);Multi-band visible and IR optical film on ZnS substrate[J];Infrared and Laser Engineering;2009-05
4 Li Bincheng1 Gong Yuan2 1Key Laboratory of Beam Control Institute of Optics and Electronics,Chinese Academy of Sciences,Chengdu,Sichuan 610209,China 2School of Communication and Information Engineering University of Electronic Science and Technology of China,Chengdu Sichuan 610054 China;Review of Cavity Ring-Down Techniques for High Reflectivity Measurements[J];Laser & Optoelectronics Progress;2010-02
【Secondary Citations】
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1 LIU Hong-xiang, XIONG Sheng-ming, LI Ling-hui, ZHANG Yun-dong (Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China);Experimental study for ion beam sputtering deposition of Ta_2O_5 optical thin film[J];Opto-electronic Engineering;2004-03
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