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《Ship Electronic Engineering》 2012-11
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Application of Boundary-Scan Technology in Non-Boundary-Scan Devices Testing

CHEN Yanshen ZHANG Bo LI Yanqing(Naval Radar and Sonar Repairing Factory,Qingdao 266100)  
In modern times,circuit board becomes more and more complicated,and it is more and more difficult for physical accessing to the circuit node.Traditional ICT technology and ATE technology can not satisfy the requirement of fault detection and diagnosis.The effective means for solving this problem is boundary-scan technology.The boundary-scan technology not only apply to test the boundary-scan chips,but also test the non-boundary-scan devices by writing macro language.
【CateGory Index】: TN407
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