An Artificial Intelligence Method for Detecting the Failure of Transistors
WANG Jing-huan;ZHUANG Han-qi;College of Aeronautical Engineering, Nanjing Institute of Industry Technology;
Aiming at fault diagnosis and classification of transistor failure, fault injection method is used in the classic analog amplifier circuits. The fault characteristic data can be obtained efficiently and quickly by using the fault injection method. Based on probabilistic neural network, a network model with high accuracy is obtained after processing the input data and adjusting the Spread value, and it is also verified in the actual circuit.
【CateGory Index】： TP18;TN32