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《Computer Engineering and Applications》 2010-30
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Sub-pixel measurement method for narrow cracks in industrial CT image

ZENG Li1,3,AN Bei-bei1,2,YUE Xiu-juan1,31.ICT Research Center,Key Laboratory of Optoelectronic Technology and System of the Education Ministry of China,Chongqing University,Chongqing 400044,China 2.Chongqing Institute of Environmental Science,Chongqing 400020,China 3.College of Mathematics and Physics,Chongqing University,Chongqing 400044,China  
This paper mainly solves the problem of measuring the small crack in industrial CT(Computer Tomography) images.Ridgelet transform is developed from wavelet transform.The idea of ridgelet transform is that turns line singularity into point singularity according to radon transform,and then deals with point singularities using wavelet in radon domain.Therefore,it is appropriate that ridgelet transform can detect the defects in images such as cracks,which have line singularities,and it can suppress the point noises in images.In this paper,image is firstly projected,one-dimensional wavelet transform is next applied to projections,then do approach on the crack,reduce the scope of crack.Finally the edge of the crack can be obtained.But the measured width of cracks is larger than true width because of the influence of point pervasion in CT images.The width shrinkage and scale calibration are used in this paper.An industrial CT testing image is used to do experiment.The result of the measurement can reach sub-pixel accuracy.The ridgelet transform,edge approach and width shrinkage are used for measuring the small crack in industrial CT image.This presented method can also be applied to other measurements.
【Fund】: 国家自然科学基金No.60672098;; 国家高技术研究发展计划(863)No.2006AA04Z104~~
【CateGory Index】: TP391.41
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