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《Journal of Computer-Aided Design & Computer Graphics》 2007-02
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Test and Design-for-Testability of IIR Filter

Xiao Jixue1,2) Chen Guangju1) Xie Yongle1)1)(College of Automation, University of Electronic Science and Technology of China, Chengdu 610054)2)(School of Mechanical Engineering & Automatization, Xihua University, Chengdu 610039)  
Based on arithmetic additive generator, we present an universal design-for-testability and test strategy for infinite impulse response (IIR) filter. The design improves the circuit testability by the aid of cutting off feedback loops in IIR filter in test mode. Reuse of some adders and registers in IIR filter design-for-testability, additional hardware and area overhead are reduced. The test strategy can detect any combinational stuck-at faults within the circuit basic building cell efficiently without degradation of circuit performance.
【Fund】: 国家自然科学基金(90407007)
【CateGory Index】: TN713
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【Secondary References】
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