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《Chinese Journal of Computers》 1991-03
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DEEP KNOWLEDGE-BASED TWO-STEP DIAGNOSTIC REASONING FOR MULTIPLE FAULTS

Zheng Xiaojun(Beijing Institute of System Engineering, Beijing 100101)Yang Shuzi and Shi Hanmin(Huazhong University of Science and Technology, Wuhann 430072)  
Some concrete issues on the deep knowledge-based two-step diagnostic reasoning are studied and a new algorithm for candidate generation in the concurrent diagnostic method is presented. In the sequential diagnostic method the problem of how to select the best measurement and resolute the measuring results are solved. A compound diagnostic strategy integrating the concurrent diagnostic method with the sequential one is presented.
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