Full-Text Search:
Home|Journal Papers|About CNKI|User Service|FAQ|Contact Us|中文
《Chinese Journal of Computers》 2004-04
Add to Favorite Get Latest Update

Efficient Test Data Compression and Decompression Based on Alternation and Run Length Codes

LIANG Hua-Guo 1) JIANG Cui-Yun 2) 1) (Institute of Computer and Information, Hefei University of Technology, Hefei 230009) 2) (Department of Information and Computing Science, Hefei University of Technology, Hefei 230009)  
This paper proposes a new class of variable-to-variable-length compression codes that are called as Alternation and Run Length codes(ARL). Lengths of runs of 0s and 1s, as well as alternating bits in test sequences are directly encoded to compress a precomputed test set without limitation only to the run of 0s as proposed. ARL code consists of two parts, namely alternation and run parts. Its decompression architecture for on-chip pattern generation is simple and does not require a separate CSR. The experimental results show that ARL codes can efficiently compress test data and are more superiority to variations in an input data steam than Golomb and FDR codes.
【Fund】: 国家自然科学基金 ( 60 44 40 0 1)资助
【CateGory Index】: TN402
Download(CAJ format) Download(PDF format)
CAJViewer7.0 supports all the CNKI file formats; AdobeReader only supports the PDF format.
【References】
Chinese Journal Full-text Database 10 Hits
1 FANG Xiang-Sheng~1,CHAO Xian-Xia~2(1.Anhui Economy Administration Institute,Hefei 230059,China;2.Anhui Highway Engineering Artificer School,Hefei 230051,China);Testing research for the SOC logic BIST[J];Journal of Anhui Institute of Architecture & Industry(Natural Science);2006-03
2 LU Jun1,2,LIU Da-xin1,CHEN Li-yan2(1.College of Computer Science and Technology,Harbin Engineering University,Harbin 150001,China;2.College of Computer Science and Technology,Heilongjiang University,Harbin 150080,China);Compression method with constant degree based on permutation and combination[J];Journal of Dalian Maritime University;2008-04
3 PENG Xi-yuan,YU Yang(Department of Automatic Test and Control,Harbin Institute of Technology,Harbin,Heilongjiang 150001,China);A Test Set Compression Algorithm Based on Variable-Run-Length Code[J];Acta Electronica Sinica;2007-02
4 OUYANG Yi-ming,CHENG Li-li,LIANG Hua-guo (School of Computer and Information,Hefei University of Technology,Hefei,Anhui 230009,China);A New Test Data Compression and Decompression Technique Based on Statistic Relativity of Variable Length Data Block[J];Acta Electronica Sinica;2008-02
5 FANG Hao,YAO Bo,SONG Xiao-di,CHENG Xu (Room 1815,Science Building 1,Peking University,Beijing 100871,China);The Algorithm of Filling X Bits in Dual-Run-Length Coding[J];Acta Electronica Sinica;2009-01
6 Zhang Lei,(School Lofi aCnogm pHutuear ganudo I,nfToramoa tJioun,eHheufeii University of Technology,Hefei,230009);A Generalized Alternating Run-Length Coding Based On Test Set Partition[J];Electronics Quality;2007-08
7 FANG Hao,SONG Xiaodi,CHENG Xu Department of Computer Science and Engineering,School of Electronics Engineering and Computer Science,Peking University,Beijing 100871;CacheCompress:A Novel Approach for Test Compression for IP Cores[J];Acta Scientiarum Naturalium Universitatis Pekinensis;2009-05
8 ZHAN Wen-fa~(1,2),LIANG Hua-guo~1,SHI Feng~1,HUANG Zheng-feng~1 (1.School of Computer and Information,Hefei University of Technology,Hefei,Anhui 230009,China; 2.Department of Educational Technology,Anqing Normal College,Anqing,Anhui 246011,China; 3.School of Electronic Science and Applied Physics,Hefei University of Technology,Hefei,Anhui 230009,China);A Test Data Compression Scheme Based on Mixed Fixed and Variable Run-length Coding in Virtual Block[J];Acta Electronica Sinica;2009-08
9 Ouyang Yiming Zou Baosheng Liang Huaguo Huang Xi’e (School of Computer and Information, Hefei University of Technology, Hefei 230009, China);Test data compression of system-on-a-chip (SoC) based on partial runs reversing[J];Journal of Electronic Measurement and Instrument;2010-01
10 ZHANG Nian,LIANG Hua-guo,ZHU Shen-cai,YE Yi-qun(School of Computer and Information,Hefei University of Technology,Hefei 230009,China);Test data compression based on grouping of share seeds and bit-flipping[J];Journal of Hefei University of Technology(Natural Science);2008-08
China Proceedings of conference Full-text Database 1 Hits
1 ZHANG Lei JIANG Cui-yun LIANG Hua-guo TAO Jue-hui School of Computer and Information, Hefei University of Technology, Hefei, Anhui, 230009;A Generalized Alternating Run-Length Coding Based On Test Set Partition[A];[C];2007
【Citations】
Chinese Journal Full-text Database 1 Hits
1 LIANG Hua Guo ①, Sybille Hellebrand ②, and Hans Joachim Wunderlich ③ ①(Department of Computer and Information, Hefei University of Technology, Hefei 230009) ②(Institute of Applied Computer Science, University of Innsbruck, Innsbruc;A DETERMINISTIC BIST SCHEME BASED ON RESEEDING OF FOLDING COUNTERS[J];Journal of Computer Research and Development;2001-08
【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 FANG Xiang-Sheng~1,CHAO Xian-Xia~2(1.Anhui Economy Administration Institute,Hefei 230059,China;2.Anhui Highway Engineering Artificer School,Hefei 230051,China);Testing research for the SOC logic BIST[J];Journal of Anhui Institute of Architecture & Industry(Natural Science);2006-03
2 LI Jun,CHENG Li,XU Zhi-chun,HANG Qing-fu,ZHANG Rong-biao,ZHANG Hui(School of Electricity and Information,Jiangsu University,Zhenjiang 212013,China);Low-Power BIST Methodology Based on Scan-Chain Reorder[J];Semiconductor Technology;2007-09
3 OUYANG Yi-ming,CHENG Li-li,LIANG Hua-guo (School of Computer and Information,Hefei University of Technology,Hefei,Anhui 230009,China);A New Test Data Compression and Decompression Technique Based on Statistic Relativity of Variable Length Data Block[J];Acta Electronica Sinica;2008-02
4 Chen Wei-bing1,2 Liu Wen-yan2( 1.Institute of Computer and Information ,Hefei 230009 ,China;2.Physics Department Fuyang Normal College, Fuyang 236032, China);Low Power Design of Folding Controller[J];Electronics Quality;2005-02
5 Chen Wei-bing1,2( 1.Institute of Computer and Information , Hefei 230009,China;2.Physics Department Fuyang Normal College, Fuyang 236032,China);Low Power Design of Mixed-mode BIST Based on Folding Set[J];Electronics Quality;2005-03
6 Zhao Ming, Chen Wei-Bing ( Physics Department Fuyang Normal College, Fuyang 236041,China );A New Low Power Design of Mixed-mode BIST[J];Electronics Quality;2006-05
7 Chen Wei-bing,Tang Lan (Physics Department Fuyang Normal College,Fuyang 236041,China);Improvement on Test Generator Based on FPGA[J];Electronics Quality;2007-10
8 Chen Wei-bing (Physics Department Fuyang Normal College,Fuyang 236041,China);A Low Power Design of Mixed-mode BIST Based on Scanning Structure[J];Electronics Quality;2007-12
9 Chen WeibingZhao Ming(Physics Department Fuyang Normal College,Fuyang 236032);Low power design of mixed-mode BIST[J];Foreign Electronic Measurement Technology;2006-02
10 YU Jing,LIANG Hua-guo,JIANG Cui-yun(School of Computer and Information,Hefei University of Technology,Hefei 230009,China);Distance-marking compression method based on compatible compression of multiple scan chains[J];Journal of Hefei University of Technology(Natural Science);2006-01
China Proceedings of conference Full-text Database 6 Hits
1 ZHANG Lei LIANG Huaguo TAO Juehui Institute of Computer and Information Hefei University of Technology, Hefei Anhui, 230009;Two Compressions Test Data Compression Based on Test Set Partition in Multiple Scan Chains[A];[C];2006
2 Liang Hua-guo, Fang Xiang-sheng (School of computer and information, Hefei University of Technology, Hefei 230009);A IMPROVED BIST SCHEME BASED ON FOLDING COUNTER[A];[C];2004
3 Tao Juehui Liang Huaguo Zhang Lei (College of Computer and Information, Hefei University of Technology, Hefei Anhui 230009);Standard Vector Compression Based on Test Set Grouping in Multiple Scan Chains[A];[C];2006
4 Zhou Bin Ye Yi-zheng Microelectronics Center,Harbin Institute of Technology,Harbin 150001,China Department of Computer Science and Technology,Tsinghua University,Bejing 100084,China Li Zhao-lin Wang Zhi-wei Heilongjiang Communication Centre of Transportation and Information,Harbin 150001,China.;Two-Dimensional Test Data Compression Based on TRC-Reseeding[A];[C];2008
5 Jiang Cuiyun Liang Huaguo Tao Juehui Chen Tian School of Science School of Computer and Information Hefei University of Technology Hefei Anhui 230009;Test Data Partition with Fixed-length Blocks and Compression by Grouped Dictionary Encoding[A];[C];2008
6 Wang Baoqing~1 Liang Huaguo~1 Zhan Wenfa~(1,2) 1 College of Computer and information,Hefei University of Technology,Hefei 230009 2 Department of Educational Technology,Anqing Normal College,Anqing 246011;Application of group and expansion code in Test Data Compression[A];[C];2008
【Co-references】
Chinese Journal Full-text Database 10 Hits
1 LI Jia-yuan,CHENG Li,WANG Zhen-yu,LI Hua-le,HE Xing(Institute of Electricity and Information,Jiangsu University,Zhenjiang 212013,China);Reusable IP Technology in SOC Design[J];Semiconductor Technology;2006-01
2 LI Jun,CHENG Li,XU Zhi-chun,HANG Qing-fu,ZHANG Rong-biao,ZHANG Hui(School of Electricity and Information,Jiangsu University,Zhenjiang 212013,China);Low-Power BIST Methodology Based on Scan-Chain Reorder[J];Semiconductor Technology;2007-09
3 GUI Zhi guo\+1, BO Rui feng\+2, HAN Yan\+1 (1. Dept. of Electronic Engineering and Information Science, North China Institute of Technology; 2. Dept. of Mechanical Engineering, North China Institute of Technology, Taiyuan 030051, China);Fast Algorithm of Image Matching by Projection[J];JOURNAL OF TEST AND MEASUREMENT TECHNOLOGY;2000-01
4 CHEN Hai tao (WuHan Maritime Communication Reseach Insititute,Wuhan Hubei 430079,China);Design of loaded antennas using a modified genetic algorithm[J];Chinese Journal of Radio Science;2002-01
5 ZHOU Wei hong HE Jian guo ZHOU Dong ming(Institute of Electronic Science and Engineering, NUDT, , Hunan Changsha 410073, China);Optimized design of a new kind of GPR planar antenna[J];Chinese Journal of Radio Science;2004-03
6 CHEN Yu-xi 1 HAN Chong-zhao 1 WANG Ming-jun 2 KANG Xin 1(1 School of Electronics and Information Engineering, Xi′an Jiaotong University, Xi′an Shanxi 710049, China;2 Network & Information Center, Xi′an University of Architecture & Technology, Xi′an Shanxi 710055, China );A study of remote sensing image matching based on combination of wavelet transformation and image invariant moment[J];Chinese Journal of Radio Science;2004-04
7 JI Yi-cai~1,2 LIU Qi-zhong~1 YIN Ying-zeng~1 GE De-biao~2 (1.National Laboratory of Antennas and Microwave Technolo gy Xidian U niversity, ycji@mail.xidian.edn.cn, Xi′an Shaanxi 710071, China; 2.School of science, Xidian University, Xi′an Shaanxi 710071, China);Design of broadband loaded helical antennas using a hybrid genetic algorithm[J];Chinese Journal of Radio Science;2005-02
8 CHEN Hai-tao~ 1, 2 WANG Ti-hao~2 ZHU Guo-qiang~1ZHANG Yun-hua~1 ZHANG Zi-zhen~2 XIONG Ye~2(1.College of Electronic Information, Wuhan University, Wuhan Hubei 430072, China;2.Wuhan Maritime Communication Research Institute, Wuhan Hubei 430079, China );Numerical analysis of horizontal wire antenna connecting ground above multi-layered medium[J];Chinese Journal of Radio Science;2006-02
9 Pan Jin; Wen Xili(Dept. of Mierowave Eng.,UEST of China Chengdu 610054);A NEW TECHNIQUE FOR COMPUTATING SOMMERFELD INTEGRAL[J];JOURNAL OF UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA;1994-05
10 LIANG Jun, HU Hai-bo, ZHANG Ming ( Department of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China );Design of Phase Shifter for Logic BIST[J];Journal of Circuits and Systems;2004-04
China Proceedings of conference Full-text Database 1 Hits
1 Shi wan-chun(Institute of Computing Technology, Chinese Academy of Sciences,Beijing 100080);System On-a-Chip (SOC) Testing[A];[C];2004
【Secondary References】
Chinese Journal Full-text Database 10 Hits
1 LU Jun1,2,LIU Da-xin1,CHEN Li-yan2(1.College of Computer Science and Technology,Harbin Engineering University,Harbin 150001,China;2.College of Computer Science and Technology,Heilongjiang University,Harbin 150080,China);Compression method with constant degree based on permutation and combination[J];Journal of Dalian Maritime University;2008-04
2 Liu Jie1,2 Liang Huaguo1 Xu Sanzi1 (1. School of Computer and Information, Hefei University of Technology, Hefei 230009, China; 2. School of Physics and Electronic Science, Fuyang Normal College, Fuyang 236041, China);Test data compression technology based on blocking code and optimal sort algorithm[J];Journal of Electronic Measurement and Instrument;2009-05
3 LIANG Hua-guo,ZHU Shen-cai,CHEN Tian,ZHANG Nian(School of Computer and Information,Hefei University of Technology,Hefei,Anhui 230009,China);A Test Scheme Based on RAS Structure to Reduced Test Volume and Time[J];Acta Electronica Sinica;2008-12
4 FANG Hao,YAO Bo,SONG Xiao-di,CHENG Xu (Room 1815,Science Building 1,Peking University,Beijing 100871,China);The Algorithm of Filling X Bits in Dual-Run-Length Coding[J];Acta Electronica Sinica;2009-01
5 FANG Hao,SONG Xiaodi,CHENG Xu Department of Computer Science and Engineering,School of Electronics Engineering and Computer Science,Peking University,Beijing 100871;CacheCompress:A Novel Approach for Test Compression for IP Cores[J];Acta Scientiarum Naturalium Universitatis Pekinensis;2009-05
6 WU Xiao-yin1,2,LIANG Hua-guo1,ZHAN Kai-hua1,WU Yi-cheng1,LI Jian-xin1,2 1.Institute of Computer and Information,Hefei University of Technology,Hefei 230009,China 2.Department of Computer Science and Technology,Suzhou College,Suzhou,Anhui 234000,China;LFSR reseeding methodology based on partial consistency[J];Computer Engineering and Applications;2008-18
7 Liang Huaguo1)Liu Jun1)Jiang Cuiyun2)Ouyang Yiming1)Yi Miaoxiang2)1)(School of Computer and Information,Hefei University of Technology,Hefei 230009)2)(School of Science,Hefei University of Technology,Hefei 23009);Constraint Input Reduction BIST Scheme for Multiple Scan Chains[J];Journal of Computer-Aided Design & Computer Graphics;2007-03
8 Tao JuehuiLiang HuaguoZhang Lei(School of Computer and Information,Hefei University of Technology,Hefei230009);Standard Vector Compression Based on Test Set Grouping for Multiple Scan Chains[J];Journal of Computer-Aided Design & Computer Graphics;2007-06
9 ZHAN Wen-Fa1),2) LIANG Hua-Guo1) SHI Feng1) HUANG Zheng-Feng1)1)(School of Computer and Information,Hefei University of Technology,Hefei 230009)2)(Department of Educational Technology,Anqing Normal College,Anqing,Anhui 246011);A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding[J];Chinese Journal of Computers;2008-10
10 SHAO Jing-bo1,MA Guang-sheng1,ZHANG Rui-xue2(1.College of Computer Science & Technology,Harbin Engineering University,Harbin Helongjiang 150001,China;2.Department of Computer,Harbin High Financial College,Harbin Helongjiag 150040,China);Two level core test compression based on partial test vector reuse and VRL coding[J];Journal of Computer Applications;2008-03
©2006 Tsinghua Tongfang Knowledge Network Technology Co., Ltd.(Beijing)(TTKN) All rights reserved