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《Acta Metallurgica Sinica》 2013-08
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WANG Shaogang,WANG Sucheng,ZHANG Lei Shenyang National Laboratory for Materials Science,Institute of Metal Research,Chinese Academy of Sciences, Shenyang 110016  
The continuing development of X-ray light sources,optical devices and image analysis technologies enables us to nondestructively analyze internal structures of materials by using 3D imaging with a spatial resolution of micron,even dozens of nanometers.Innovations in materials science and technology will benefit from the new achievements of the X-ray tomography with higher resolution.This article devotes to review the origination and development of the X-ray tomography techniques for 3D imaging and introduce the principles and specifications of three imaging methods, including absorption imaging,phase contrast imaging and holographic imaging.The differences between synchrotron-based and laboratory-based X-ray tomography are also discussed.To explore new opportunities of the high resolution X-ray tomography in the development of material science and technology,particular emphasis is laid on the applications for traditional materials with a 3D view, such as the characterizations of holes,cracks,corrosion,composites,and in situ testing etc..
【CateGory Index】: TP391.41;TB30
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