Development of a high precision scanning frame for compact antenna test range
ZHANG Hou-jiang (School of Technology, Beijing Forestry University, Beijing 1 00083, China) FAN Rui,CHEN Wu-yi (School of Mechanical Engineering and Automation, Beijing University of Aeronautics and Astronautics,Beijing 100083, China)
High precision scanning frame is one of key equipments for testing a new CATR(Compact Antenna Test Range) and regularly calibrating a CATR which has been using. The scanning plane that formed by the movement of microwave sensor should have a high precision planeness. A high precision scanning frame with rig ht-angle coordinate movement style is developed. A precision adjusting mechanis m is designed on the slide block which carries the microwave sensor, and it is u sed to compensate position error of the microwave sensor along microwave moving direction. It is indicated by the testing results that the planeness of this sca nning frame is less than 0.04mm, and it can be used to test the CATR with the fr equency of more than 100GHz.
【CateGory Index】： TM931