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《Computer Measurement & Control》 2012-07
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A Research of an Extend Application of Boundry Scan Test

Yu Tingxiang1,Xu Pengfei2,Wang Jian1,Wang Xiangji1(1.93325 Unit of PLA,Shenyang 110141;2.93251 Unit of PLA,Qiqihaer 161000)  
It is difficult to test the open fault between boundary scan device and vacant connector in the application of boundary scan technique.This thesis combine boundary scan with ICT to solve the problem by learning foreign experience.A boundary scan device is used to stimulus a signal and a capacitance is used to receive the response.The fault node capacitance is small than normal value obviously.Then,the open fault node is detected.This method is proved to be feasible by experiments.The advantage and disadvantage is summarized at last.We hope that this method is a good reference to the relevant research and application.
【CateGory Index】: TN606
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