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《Computer Measurement & Control》 2013-02
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Research and Implement of SRAM Test Based on Boundary Scan

Chen Shouhong,Yan Xuelong,Huang Xin(School of Electronic Engineering&Automation,Guilin University of Electronic Technology,Guilin 541004,China)  
Static random access memory(SRAM) is widely used and must be fully tested to ensure the high reliability.The virtual probe technology of boundary scan is applied to realize the SRAM test.SRAM function structure is analyzed and the test model is then established.The DEMO board is designed for test by using HY6264 and the test information is described by the TCL language.Test results show that the presented test method can accomplish the test and fault diagnosis for SRAM inner memory cell and peripheral lines including the control lines,data lines and address lines,results correct and diagnosis locations specific,which has good application foreground.
【Fund】: 国家自然科学基金项目(61102012)
【CateGory Index】: TP333.8
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