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《Cereal & Feed Industry》 2004-05
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Using Atomic Force Microscopy (AFM) in the Nanometer Structure Imaging of Starch

The working principle of atomic force microscopy (AFM) is discussed. And as for the AFM imaging of starch structure, more specifically, the pretreatment of the samples, the observation of molecular chains, and the nanometer structures of the surface and inner surface of starch are illustrated. The prospects of applying AFM in starch nanometer structure imaging is looked ahead.
【CateGory Index】: TS236
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