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《Transactions of The Chinese Society of Agricultural Machinery》 2003-04
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Research on the Tracing of Dynamic Measuring Error Based on Wavelet-neural Network

Xu Zhenying Fei Yetai (Hefei University of Technology)  
The demands of modern high accuracy dynamic measuring technology to the accuracy theory, especially to the dynamic accuracy, are more and more improved. The traditional dynamic accuracy theory can't satisfy these demands now. In this paper, a new dynamic accuracy theory is developed. It called the theory of the tracing of dynamic measuring error. The total output error is discomposed to the internal units as well as the external noises. And its modeling methods are discussed. Wavelet neural network is an important method in modern signal processes. It combines the merits of wavelet transform and neural network. By means of Wavelet neural network, and based on the “whitening” model, the research on the error tracing of a simulated system is performed. The satisfactory results proved the correction and possibility of the new theory.
【Fund】: 国家自然科学基金资助项目 (项目编号 :5 973 5 12 0 );; 高等学校博士学科点专项科研基金资助项目 (项目编号 :2 0 0 0 0 0 3 5 90 5 )
【CateGory Index】: TB9
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