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Observation on Etch Pits on the (110) Faces of Cd_(1-x)Zn_xTe Crystals

GAO De-you,ZHAO Bei-jun,ZHU Shi-fu,WANG Rui-lin,WEI Zhao-rong, LI Han-dong,WEI Yong-lin , TANG Shi-hong (Department of Materials Science, Sichuan University, Chengdu 610064, China)  
This paper reported a new etch-pits etchant, which is able to selectively etch (110) faces of Cd_(1-x)Zn_xTe (CZT) crystals. Here it was used to etch (110) faces of the Cd-riched CZT crystal. The results show that the shape of etch pits appears as triangle on the (110) face of the crystal by SEM observation. The formation reasons for the triangle etch pits were analyzed preliminarily.It is estimated that the etch pits density (EPD) on the (110) faces of the CZT crystals is at the order of 10~3-10~5/cm~2 magnitude. It is demonstrated that the Cd-riched starting materials can grow low EPD CZT single crystals by modified Bridgman method.
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