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《Journal of Suzhou University(Natural Science Edition)》 2008-01
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The research on pairwise covering test data generation with parameter constraints

Zeng Jintao1,2,Chen Jianming1(1.The Institute of Intelligent Information Processing and Application,Suzhou Univ.,Suzhou 215006,China;2.College of Information Science and Communication Jinggangshan Univ.,Ji'an 343009,China)  
There are many papers on generation of combinatorial covering test data,but few of them introduce restriction of parameter constraints.Under this background,with an introduction of paramer constraints,a pairwise covering test data generation algorithm based on IPO method is proposed.Experiments show that in some softwares under testing,this algorithm can produce test set with smaller size than the classic AETG method.In addition,its characteristic of determinate combination makes it more effective to reduce the testing cost,so the new method is of some value both in theory and practice.
【Fund】: 2005教育部科研重点项目(205059)
【CateGory Index】: TP311.52
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1 NIE Chang Hai XU Bao Wen (Department of Computer Science and Engineering, Southeast University, Nanjing 210096) (Jiangsu Institute of Software Quality, Nanjing 210096);An Algorithm for Automatically Generating Black-Box Test Cases Based Interface Parameters[J];Chinese Journal of Computers;2004-03
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【Co-citations】
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1 NIE Nan1, 2, XIA Qi-ming1, YAO Jun-feng1, and HE Ke-qing1 (1. State Key Laboratory of Software Engineering, Wuhan, University Wuhan 430072; 2. School of Computer and Communication, Zhengzhou University of Light Industry Zhengzhou 450002);Component Interface -Oriented XACML Mutation Testing Policies[J];Journal of University of Electronic Science and Technology of China;2009-02
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4 Chen Jinfu,Lu Yansheng,and Xie Xiaodong(School of Computer Science and Technology,Huazhong University of Science and Technology,Wuhan 430074);A Fault Injection Model of Component Security Testing[J];Journal of Computer Research and Development;2009-07
5 ZHOU Xiao-Yu;NIE Chang-Hai;XU Bao-Wen;CHEN Huo-Wang Department of Computer Science & Engineering, Southeast University, Nanjing 210096 Jiangsu Institute of Software Quality, Nanjing 210096 State Key Laboratory of Software Engineering, Wuhan University, Wuhan 430072 School of Computers, National University of Defense Technology, Changsha 410073;Design and Implement of a Tool for Pairwise Testing Data Generation[J];Computer Science;2005-01
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7 XU Bao-Wen~(1),2),3),4)) NIE Chang-Hai~(1),2)) SHI Liang~(1),2)) CHEN Huo-Wang~(2))~(1))(Department of Computer Science and Engineering,Southeast University,Nanjing 210096)~(2))(Jiangsu Province Institute of Software Quality,Nanjing 210096)~(3))(School of Computer Science,National University of Defense Technology,Changsha 410073)~(4))(Key Laboratory of Software Engineering,Wuhan University,Wuhan 430072);A Software Failure Debugging Method Based on Combinatorial Design Approach for Testing[J];Chinese Journal of Computers;2006-01
8 NIE Chang-Hai XU Bao-Wen SHI Liang(School of Computer Science and Engineering,Southeast University,Nanjing 210096)(Jiangsu Institute of Software Quality,Nanjing 210096);A New Pairwise Covering Test Data Generation Algorithm for the System with Many 2-Level Factors[J];Chinese Journal of Computers;2006-06
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1 ;Pairwise Covering Test Data Generation based on Solution Space B-Tree[A];[C];2009
【Co-references】
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