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《JOURNAL OF SHANGHAI JIAOTONG UNIVERSITY》 1994-06
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The Study of Thin Film X-ray Stress Analysis

Yang Yuxing;Hu Gengxiang  
It is difficult to get the same precision of thin film X-ray stress analysis(TFXSA)as the conventional stress analysis, due to the characteristic of thin film X-ray diffraction geometry.The preci of TFXSA may be improved by vacuum slit and internal standard calibration described in this article. At the same time,the stress analysis of high temperature oxide scales is introduced briefly in the paper, in order to determining the growth stresses in growing oxide scales.
【Fund】: 国家自然科学基金
【CateGory Index】: O484.5
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