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《Journal of Experimental Mechanics》 2002-03
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Progress of Time-Sequence Speckle Metrology and its Applications

LI Xi de (Dept. of Engineering Mechanics, Tsinghua University, Beijing 100084)  
If a laser beam illuminates a continual deformation object surface, it will lead to a temporal speckle pattern on the observation plane. Recording this time dependent speckle pattern the surface deformation of the object can be obtained. In this paper, the new developed methods in temporal speckle pattern interferometry (TSPI) have been introduced and their performance in temporal measurements is investigated. Finally, the applications of different measurement methods in TSPI are also presented.
【Fund】: 自然科学基金项目 10 0 72 0 3 1;; 教育部高等学校访问学者基金资助
【CateGory Index】: O348
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【Citations】
Chinese Journal Full-text Database 2 Hits
1 Li Xide Wu Xiaoping(Department of Mechanics and Mechanical Engineering,University od Science and Technology of China, Hefei 230026);Temperature Field Reconstruction by Carrier Electronic Speckle Pattern Interferometry and Computerized Tomography[J];Acta Optica Sinica;1998-01
2 Li Xide,Tao Gang,Deng Bing,Yang Yizhang,Shi Huiji Dept.of Engineering Mechanics,Tsinghua University,Beijing 100084;TIME-SEQUENCE SPECKLE METROLOGY AND ITS APPLICATIONS[J];Acta Photonica Sinica;2002-08
【Co-citations】
Chinese Journal Full-text Database 1 Hits
1 Li Xide,Tao Gang,Deng Bing,Yang Yizhang,Shi Huiji Dept.of Engineering Mechanics,Tsinghua University,Beijing 100084;TIME-SEQUENCE SPECKLE METROLOGY AND ITS APPLICATIONS[J];Acta Photonica Sinica;2002-08
【Secondary Citations】
Chinese Journal Full-text Database 2 Hits
1 Tao Gang Li Xide (Department of Engineering Mechanics, Tsinghua University, Beijing 100084);Phase Map Retrieve with Temporal Speckle Pattern Interferometry[J];Acta Optica Sinica;2001-10
2 Li Xide Wu Xiaoping(Department of Mechanics and Mechanical Engineering,University od Science and Technology of China, Hefei 230026);Temperature Field Reconstruction by Carrier Electronic Speckle Pattern Interferometry and Computerized Tomography[J];Acta Optica Sinica;1998-01
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