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《Electronic Test》 2010-01
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Implementation of mixed-signal integrated circuits boundary-scan test

Yang Bing1,Jiang Yan-feng1 ,Zhang Dong2(1.Microelectronic Center,College of Information Engineering,North China University of Technology,Beijing 100144,China;2.Beijing Institute of Auto-Testing Technology,Beijing,100088,China)  
IEEE1149.4 for mixed-signal test provides a standard,but also provides an important design for testability(DFT) technology,which can not only test chip or PCB pins link between the existence of the fault,can test chip logic function.The article IEEE1149.4 standards-based,with some mix-singnal scal test equipments,complete mixed-signal circuit parameters tested.
【Fund】: 教育部新世纪优秀人才计划(2008)资助
【CateGory Index】: TN407
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【Citations】
Chinese Journal Full-text Database 4 Hits
1 Zhang Xiduo,Yi Xiaoshan,Hu Zheng (College of Mechatronics Engineering and Automation,National Univ.of Defense Technology,Changsha 410073,China);Design of Mixed-signal Boundary-scan Test Controller Based on IEEE1149.4[J];Computer Measurement & Control;2006-05
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【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 Sun Qiyan~(1,2) Lin Wei~1 (1.Fuzhou University Fujian key Laboratory of Microelectronics ~ Integrated Circuits,Fuzhou 350002;2.Fuiian Agriculture And Forestry University College of Computer and Information Technology,Fuzhou 350002);Design of boundary-scan circuit in RISC CPU[J];Foreign Electronic Measurement Technology;2008-10
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