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《Electronic Test》 2011-07
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Review on IEEE 1149.4 analog and mixed signal test bus standard

Jiang Yanfeng1,2 ,Zhang Dong 1,Wang Xin1 (1 Beijing Institute of Auto-Testing Technology, Beijing, 100088; 2 Microelectronic Center, North China University of Technology, Beijing, 100144)  
The Analog and Mixed-Signal Boundary-Scan Standard, IEEE1149.4 was developed to measure external discrete components in a mixed-signal Printed Circuit Assembly (PCA). This bus uses 4 of the same signals used today to support IEEE1149.1 compliant devices and systems. It uses two additional wires bus to perform analog monitoring and control. But testing a mixed-signal PCA is a crucial issue not only when the PCA is a traditional board but also for what is often in System on Chip (SoC) with embedded mixed-signal module. Although the original intention of the boundary-scan standard was to make provision for mixed-signal chips on boards of all kinds, SoC testing solutions cover the needs for board testing. This paper describes the basic architecture of the test bus, gives some system measurement methodologies and provides basic examples of usage.
【Fund】: 北京市科学技术研究院创新团队计划项目资助(IG201005N)
【CateGory Index】: TN407
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