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《Microcomputer Information》 2010-31
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A new Approach to Michelson Interference Fringe Counting

LIN Jiang-hao MA Wen-hua QI Jian-jun LI Xin-guang(Department of Computer Science & Technology,GuangDong University of Foreign Studies,GuangZhou,510006,China)  
In application to Michelson interference fringe,people used to count the interference fringe in the traditional method,which induces poor stability and large error in counting. In this paper,we propose arithmetic based on gradient for counting the Michelson interference fringe. This arithmetic first digital filter the signal and find out the validated reference point and range automatically,then count the interference fringe make use of gradient operator. Experimental result shows that the counter designed by this arithmetic has greater stability and high accuracy.
【CateGory Index】: TH744.3
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【Citations】
Chinese Journal Full-text Database 7 Hits
1 LI Dong guang 1, ZHANG Guo xiong 2 (1 School of Mechatronics, Beijing Institute of Technology, Beijing 100081, China) (2 College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072, China);Measuring refractive index of air by using a pre-evacuated airtight sealed cavity and its accuracy analysis[J];OPTICAL TECHNOLOGY;2000-06
2 Yuan Jianhui Zhou Lisheng Zhao Fuli Dong Ya(Department of Physics, Zhongshan University, Guangzhou 510275);Measurement of Liquid Refractive Index with Michelson Interferometer and Regulation of the Instrument[J];Optical Technique;1998-01
3 SHI Mei-hong FANG Chao ZHANG Wei-jun QIU Han(Department of Computer Science; Xi an Polytechnic University; Xi an Shaanxi 710048; China);Realization of Logic Control of Acquiring Image From Linear CCD Camera Based on FPGA[J];Microcomputer Information;2009-14
4 LU Dan-yong,LIU Chang-jiang,ZHOU Hui-jun,ZHOU Jin(Department of Physics,Nanjing University,Nanjing 210093,China);Using Mach-Zehnder interferometer to quantitatively measure the refractive index of air and its theoretical discussion[J];Physics Experimentation;2006-12
5 Fan Suhua;Wang Peiji(Shandong Institute of Builiding Materials, Jinan, 250022);THE MEASUREMENT OF PIEZOELECTRIC CONSTANT d_(31) OF PIEZOELECTRIC CERAMIC WITH LASER INTERFERENCE METHOD[J];JOURNAL OF APPLIED OPTICS;1997-04
6 JIANG Li,LUO Shao-xuan,YANG Yan,YANG Ke-ling(School of Physics Science and Technology,Central South University,Changsha 410083,China);Thickness measurement of thin film for holographic plate by Michelson interferometer[J];Journal of Applied Optics;2006-03
7 AO Tian-yong,XIANG Bing (School of Physics and Electronics,Henan University,Kaifeng 475001,China);The Design of a Novel Fringe Counter for Michelson Interferometer[J];Journal of Zhengzhou University(Engineering Science);2008-01
【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 Li Hui 1,2 ,Xie Shusen 1,Lu Zukang 2 1 Institute of Laser,Fujian Normal University,Fuzhou 350007,China 2 National Key Lab of Modern Optical Instrumentation,Zhejiang University,Hangzhou 310027,China;DISPERSION,GROUP VELOCITY AND GROUP REFRACTIVE INDEX[J];ACTA PHOTONICA SINICA;1999-12
2 Chen Yexian Zhou Dangpei Guan Xiaoquan Wu Cuangsheng (Wuyi University,Jiangmen,529020);THE DESIGN OF A NOVEL FRINGE COUNTER FOR MICHELSON INTERFEROMETER[J];Physical Experiment of College;2009-03
3 ZHENG Zhi-yuan,FAN Zhen-jun,DONG Ai-guo,XING Jie,ZHANG Zi-li (China University of Geosciences,Beijing 100083);Measurement of Film Thickness by Michelson's Interometer[J];Physical Experiment of College;2010-05
4 Bai Shixian Shi Meihong Jiang Shoushan Ning Changsheng(1.Department of Electronic Information,Xi'an Polytechnic University,Xi'an 710048;2.Department of Computer Science,Xi'an Polytechnic University,Xi'an 710048);Design and implementation of external synchronous control for a linear CCD based on a Camera Link protocol[J];Electronic Measurement Technology;2010-11
5 XIANG Wang-hua,ZHANG Bing,LIANG jie,ZHOU Yu,JIA Guang-ming, ZHANG Gui-zhong,LIU Guo-biao,LIU Chun-jiang State Key Laboratory of Optoelectronic Information Technique and Science,School of Precision Instrument and Opto-Electronics Engineering,Tianjin University,Tianjin 300072,China; School of Chemical Engineering and Technology,Tianjin University,Tianjin 300072,China;Experimental Study on Refractive Index and ConcentrationMeasurement of Liquid by Confocal Concave Spherical Mirror Cavity F-P Interferometer[J];Journal of Tianjin University;2007-01
6 LU Xiao-dong(Physics Experimental Centre,Zhejiang Ocean University,Zhoushan 316000,China);On Computer's Sampling and Processing of Michelson Interference Fringe Data[J];Research and Exploration in Laboratory;2009-11
7 YANG Guang-wu~a,FENG Yan-zhou~b,TU Qiang~b,LIANG Zhan-shuo~b,ZHANG Lei-dong~b,JIN Yu-ling~a(a.Department of Basic Courses;b.Department of Electronics and Information Engineering,TIUC,Tianjin 300384,China);Design and Demonstration of Wavelength Auto-measure System Based on Michelson Interferomete[J];Journal of Tianjin Institute of Urban Construction;2010-03
8 GUO Chang-li(School of Science,Xi'an University of Science and Technology,Xi'an 710054,China);Analysis of Uncertainty in Measurement of Michelson Interferometer[J];Research and Exploration in Laboratory;2010-07
9 LU Dan-yong,LIU Chang-jiang,ZHOU Hui-jun,ZHOU Jin(Department of Physics,Nanjing University,Nanjing 210093,China);Using Mach-Zehnder interferometer to quantitatively measure the refractive index of air and its theoretical discussion[J];Physics Experimentation;2006-12
10 SHI You-bin,WANG Wen-hua,CHEN Chun-lei,FEI Xian-xiang(Department of Physics,Guangdong Ocean University, Zhanjiang 524088,China);A practical method to measure unknown wavelength based on interference fringe[J];Physics Experimentation;2007-11
【Secondary Citations】
Chinese Journal Full-text Database 10 Hits
1 WANG Shou quan 1, ZHANG Shao liang 2,ZHANG Wei 3 (1.Dept.of Commun.Eng.,Changchun Post and Telecommun.Inst.,Changchun 130012,China; 2.General Service Dept.of Changchun Coal Manager Inst.,Changchun 130012,China; 3.Research Section of Higher Educati;Study of interference fringe counter[J];JOURNAL OF CHANGCHUN POST AND TELECOMMUNICATION INSTITUTE;2000-02
2 CHEN Ben-yong1, WU Xiao-wei1, LI Da-cheng21.Department of measurement and control technology, Zhejiang University of Sciences, Hangzhou 310033, China; 2. Department of precision instruments, Tsinghua University, Beijing 100084, China;A Novel Software Interference Fringe-Counting Method and its Realization[J];Journal of Transcluction Technology;2004-03
3 Shan Zhaohui;Wang Jing;Ma Ting jun(Beijing Institute of Light Industry,Beijing,100037);THE THICKNESS AND REFACTURE INDEX OF SINGLELAYER FILM MEASURED BY MICHELSON INTERFEROMETER[J];PHYSICAL EXPERIMENT OF COLLEGE;1994-01
4 LUAN Lan,SHAN Hui,MA Xiu fang,SHEN Yuan hua (Department of Physics,Fudan University,Shanghai,200433,China) \ \;A deeper research on the experiment measuring the refractive index of thin glass plate with Michelson interferometer[J];COLLEGE PHYSICS;2000-11
5 LI Dong guang 1, ZHANG Guo xiong 2 (1 School of Mechatronics, Beijing Institute of Technology, Beijing 100081, China) (2 College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072, China);Measuring refractive index of air by using a pre-evacuated airtight sealed cavity and its accuracy analysis[J];OPTICAL TECHNOLOGY;2000-06
6 SONG Min~1, LI Bo-xin~2, ZHENG Ya-ru~2 (1. Department of Information Engineering, Dalian Nationality University, Dalian116600, China) (2. Department of Physics, Liaoning Normal University, Dalian116029, China);Study of optical methods for measuring the thickness of the thin films[J];Optical Technique;2004-01
7 Shen Weidong Liu Xu Ye Hui Gu Peifu (State Key labs of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027);A New Method for Determination of the Optical Constants and Thickness of Thin Film[J];Acta Optica Sinica;2004-07
8 CHEN Qiang-hua~1,YAN Ju-qun~1,LIU Zhong-yao~1,YIN Chun-yong~1,YE Xiao-you~2,XU Jie~2 (1. Department of Precision Instruments, Tsinghua University, Beijing 100084, China; 2. National Institute of Metrology, Beijing 100013, China);An Air Refractometer with Dual Vacuum Chambers Based on the Method of Equivalent Synthetic Wave[J];Acta Metrologica Sinica;2004-03
9 XI Bin, WANG Zhen-lei, QIAN Feng(School of Information Science and Engineering, East China University of Science and Technology, Shanghai 200237, China);Development and Application of Machine Vision in Industrial Detection System[J];Control Engineering of China;2006-S1
10 WEI Hong-wei YANG Ren-zhong TANG Meng-hui(Graduate School of the Chinese Academy of Sciences,Beijing,100039)(China Remote Sensing Satellite Ground Station,Beijing, 100086);Research and Realization of real-time acquiring and processing technology based on FPGA[J];Microcomputer Information;2008-13
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