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《Physics Experimentation》 2008-09
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Measuring the axial stress in elliptic aluminum film using interference method

ZHOU Si,CHEN Xun-chi,ZHOU Hui-jun,WANG Si-hui(Department of Physics,Nanjing University,Nanjing 210089,China)  
Interference method is usually used to measure the stress in circular film.In the paper,this method is extended to the case of elliptic aluminum film.Based on Stoney formula and the principle of Newton ring,the axial stresses of long and short axes in elliptic aluminum film at room temperature are measured.A stress distribution diagram is also determined.
【Fund】: 国家基金委物理学人才基地基金资助(No.J0630316)
【CateGory Index】: O484.2
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