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《Microelectronics & Computer》 2007-01
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Automatic Test Data Generation Algorithm Based on Data Flow Rules

CHEN Ji-feng, SHEN Jun-yi, WANG Xin-jun, LIU Yong, WANG Zhi-hai( College of Electronic & Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China)  
An algorithm to automatic test data generation based on data flow rules is presented in this paper. The ALL-DU-PATHS data flow rule is introduced, and the Warshall method is used to check the feasibility and mensurability of DU-pair in the algorithm. The automatic test data generation approach based on test sequence is given after selecting test sequence on DU-pair coverage. Finally, the algorithm is checked by example and experiment.
【Fund】: 国家“863”高技术研究发展计划基金项目(2003AA1Z2610)
【CateGory Index】: TP311.52
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