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《Piezoelectrics & Acoustooptics》 2011-03
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Research on Microstructure Reliability of the Termination Electrode of MLCC

SHI Guanghua1,BAO Shengxiang1,ZHUANG Libo1,WANG Rong2 (1.State Key Lab.of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology,Chengdu 610054,China;2.Chengdu Hongming UESTC New Material Co.Ltd.,Chengdu 610058,China)  
In practical application,the electronic parameter of multilayer ceramic capacitor(MLCC) will change and the reliability will degrade until MLCC is judged to be failure.Aimed at the problem of tin-coating in MLCC devices,the microstructure and components of tin-coating are studied with SEM and EDS,and the welding failure modes occurred in the outer-electrode are documented.The results show that there have been some abnormal areas on the tin-coating of samples with weldable problem produced by oxidation.Later strict solderability tests prove the results of the analysis and find the reasons for welding failure.Improved measures are also suggested according to the analysis.
【Key Words】: MLCC failure analysis oxidation termination electrode
【Fund】: 国防科工委共性基金资助项目
【CateGory Index】: TM534.1
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