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《Mathematica Applicata》 2004-01
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Testing on Upper and Lower Outliers in Exponential Samples

ZHANG Deran1,MAO Shisong2(1.Dept. of Math.,Fuyang Teachers College an Hui Fuyang 236032,China;2.Dept.of Stat.East China Normal Univ.,Shang hai 200062,China)  
In this paper,a new testing method of getting middle part and moving step by step in an exponential sample is developed,basing on classical statistical idea.As a result,the problem of testing the data with upper outliers and lower outliers is solved.
【Fund】: 安徽省教育厅自然科学研究项目 (2 0 0 4kJ30 6 )资助
【CateGory Index】: O212
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