Full-Text Search:
Home|Journal Papers|About CNKI|User Service|FAQ|Contact Us|中文
《Chinese Journal of Liquid Crystals and Displays》 2006-05
Add to Favorite Get Latest Update

Improvement of Cleaning ITO&CF Substrate Surface by Orthogonal Experiment Design

ZHANG Jin-long,JING Hai,MA Kai (Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences; North Liquid Crystal Engineering Research and Development Center, Changchun 130031, China)  
The varieties of stain caused by greasy filth and the particle, on the ITOCF substrate surface were analyzed. The stain was caused in the process of manufacture, packing and delivery. The key factors, consistency of lotion and ultrasonic cleaning condition, and optimization techniques combination about improving the clean surface were found by means of orthogonal experiment design. With the optimization techniques, the contact angle less than 5 °, and the average particle no more than 6 were obtained; The yield of CSTN-LCD with gap over 8.0 μm was improved by 2.85 %.
【Fund】: 国家自然科学基金资助项目(No.60576056)
【CateGory Index】: TN873
Download(CAJ format) Download(PDF format)
CAJViewer7.0 supports all the CNKI file formats; AdobeReader only supports the PDF format.
©2006 Tsinghua Tongfang Knowledge Network Technology Co., Ltd.(Beijing)(TTKN) All rights reserved