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《Instrument Standardization & Metrology》 2005-06
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Design of Isolation-Resistance and Leaking-Current Test System in Electric Security Tester

He Mingsong Liu Guili Li Dong Wang Yanlin (Department of Electronic Information Engineering of Beijing Institute of Machinery, Beijing 100085)  
The paper introduced the theory and design of isolation-resistance and leaking-current test system in electric security tester of instrument. The testing system, which is composed of computer system, testing circuit and MCU, is in accord with the standard of IEC 61010-2001. Its measured error is less than 1%(1σ) in the isolation- resistance range of 0MΩto 2000 MΩ and the leaking-current range of 0.01mA to 20mA. The manipulation of the system, which is centered with computer and MCU, is very convenient and is consistent to the demand of instrument development.
【Fund】: 科技部科研院所专项项目 项目号:2003EG119102 北京市重点实验室(机电系统测控)资助。
【CateGory Index】: TM934
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