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《Journal of Applied Optics》 2010-02
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Effect of MCP parameters on resolution of image intensifier

CHENG Yao-jin,SHI Feng,GUO Hui,ZHU Yu-feng,Yuan Xiao-man(1.Key Laboratory for Low-light-level Technology of COSTIND,Xi'an Institute of Applied Optics,Xi'an 710065,China;2.Xi'an Institute of Applied Optics,Xi'an 710065,China)  
The performance of microchannel plate(MCP) is very important for the resolution of image intensifier.In order to analyze the impact of MCP parameters on the resolution of image intensifier,the transverse scattering of electrons from the output surface of MCP and the elastic scattering of electrons from the non-open surface of MCP were investigated by using electron scattering theory.The results show that the resolution of image intensifier can be improved by reducing channel distance,using multilayer electrodes,increasing the depth of output electrode and increasing open area ratio.
【CateGory Index】: TN223
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【Citations】
Chinese Journal Full-text Database 3 Hits
1 PAN Jing-sheng (North Night Vision Technology Ltd.Co., Nanjing Branch,Nanjing 210006,China);Microchannel Plates And Its Main Characteristics[J];Journal of Applied Optics;2004-05
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【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 WANG Chun-ying,HAO Shi-qi,LI Hong-tao,CHEN Xiu-qiao(Electronic Engineering Institute of PLA,Hefei 230037,China);A modified feature selection approach based on structure-adaptive neural-networks[J];Electronics Optics & Control;2005-05
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3 QIN Yan-hua,ZHAO Jun-min(No.203 Research Institute of China Ordnance Industries,Xi'an 710065,China);Analysis of Identify Capability for CCD Imaging System[J];Journal of Projectiles, Rockets, Missiles and Guidance;2006-01
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6 QIU Hai-tao,WANG Dan(School of Instrumentation Science & Opto-electronics Engineering,Beihang University,Beijing 100191,China);Infrared Cooperative Target Group for Opto-electronic Landing Guidance[J];Opto-Electronic Engineering;2008-12
7 JIA Tao,WU Neng-wei,CHEN Chang-qing (Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Science,Changchun 130031,China);A New Target Searching Method Based on CCD Detecting Devices[J];Electro-optics & Passive Countermeasures;2004-04
8 WANG Sheng-chun,SHEN Wei-dong,YANG Liu,CUI Fang (Chongqing Communication College,Chongqing 40003,China);Terrestrial Vehicle RCS Analysis and Its Improved Shape Stealth Design[J];Electro-Optic Technology Application;2006-06
9 PANG Chun-ying1,2,3,ZHANG Tao1,2 (1.Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China;2.Graduate School of the Chinese Academy of Sciences,Beijing 100039,China;3.Changchun University of Science and Technology,Changchun 130022,China);Signal-to-noise ratio model of laser active imaging system[J];Optics and Precision Engineering;2008-02
10 NIU Li-hong,FENG Yu-chun,KUO Xiao-mei,WANG Yun-cheng (Institute of Optoelectronics,Shenzhen University,Shenzhen 518060,China);The developments of Si microchannel plates for electron multiplying[J];Optical Technique;2007-03
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1 LUO Chun-ping~1 LIANG Han-dong~(1,2) SUN Dong-xu~2 1.State Key Laboratory of Coal Resources and Safety Mining,Beijing 100083,China 2.Institute of Surface & Interface Chemistry,China University of Mining and Technology,Beijing 100083,China;TOF-SIMS Analysis of Coating on MCP[A];[C];2007
2 JIANG Yan-bing, YAN Hui-min, ZHANG Xiu-da, WANG Long, LI Yan, YANG Hua-jun (NERC for optical instrument, Zhejiang University, Hangzhou 310027, China);Application of binary character of optoelectronic devices in lidar based on pulse accumulation method[A];[C];2006
【Secondary Citations】
Chinese Journal Full-text Database 2 Hits
1 Tan Huiming(Changchun Institute of Optics and Precisiofi Mechanics, Academia Sinica);Apporximate Calculation of MTF of Proximity Focused Open MCP Image Intensifier[J];Journal of Applied Optics;1990-01
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