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《Journal of Jiangxi Normal University (Natural Sciences Edition)》 2004-01
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Experimental Study about Thickness and Refractive Index of Dielectric Wave-Guide

DENG Hai-dong,YE Zhi-qing,NIE Yi-you,RAO Chun-fang,LIU Hong-juan ince,Nanchang,Jiangxi 330027,China)  
The efficient refractive indexes of different modes in three-lay slab wave-guide are experimentally measured by the m-line method. The thickness and refractive index can be calculated by solving the dispersion equations. The optical field of the wave-guide is analyzed ana its distribution is calculated, which are very useful for design of optical wave-guide device.
【Fund】: 江西省自然科学基金资助项目(021002).
【CateGory Index】: TN304.05
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【References】
Chinese Journal Full-text Database 1 Hits
1 ZENG Bo, HUANG Zi-qiang2, SUN Jiu-xun (Physical Electronics School, University of Electronic Science and Technology of China, Chengdu 610054, China; Opto-electronics Information School, University of Electronic Science and Technology of China, Chengdu 610054, China);A Simple Measurement Method of the Refractive Index of Thin Transparent Materials[J];光电子技术与信息;2006-03
【Co-references】
Chinese Journal Full-text Database 10 Hits
1 HUANG Zi-qiang 1, YANG Wen-jun 1, ZENG Bo 2, XIA Du-lin 3 1 Opto-Electronic Information School, 2 Physical Electronics School, 3 Micro-Electronics and Solid-Electronic School,University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China;Modification of Scattering Theory on Powered Nematic Droplets and Parameter Fitting[J];中国激光;2005-05
2 HUANG Zuo-hua, HE Zhen-jiang, YANG Guan-ling (Department of Physics, South China Normal University, Guangzhou 510631, China);Grating diffraction interferometry for measuring film refractive index[J];光电工程;2004-06
3 Jiang guohai (Zunyi Normal College,Zunyi,563002);NEASURE THE REFFRAITIVE INDEX OF SIIFFERENT CONSISTENCY LIQID BY USING ROYLEIGH INTERFEROMETER[J];大学物理实验;2004-02
4 DENG Hai-dong,YE Zhi-qing,NIE Yi-you,RAO Chun-fang,LIU Hong-juan ince,Nanchang,Jiangxi 330027,China);Experimental Study about Thickness and Refractive Index of Dielectric Wave-Guide[J];江西师范大学学报(自然科学版);2004-01
5 Deng Guang′an 1 Cai Zhigang 1 Zhang Yunhua 1,2 Xu Yuke 1 Wu Shuizhu 3 Zhou Jianying 1 1 The State Key Lab of Optoelectronic Materials and Technologies, Sun Yat-sen University,Guangzhou 510275 2 Department of Physics,Peking University,Beijing 100871 3 College of Materials Science and Engineering,South China University of Technology, Guangzhou 510640;Refraction Index Measurement of Transparent Materials by Using Diffraction Grating and CCD[J];光学学报;2004-01
6 ZHAO Bin (Department of Basic Course, Wuhan Polytechnic University, Wuhan, Hubei 430023,China);Measurement of the thickness and refractive index of thin transparency[J];大学物理;2004-02
7 Hao Dianzhong,Wu Fuquan,Kong Weijin (Institute of Laser Research,Qufu Normal University,Qufu,273165);Measurement of refractive index of crystals with interferometry[J];激光技术;2003-05
8 Yuan Jingmei Tang Zhaosheng Qi Hongji Shao Jianda Fan Zhengxiu (Research and Development Center for Optical Thin Film Coatings, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800) (Received 28 June 2002; revised 5 September 2002);Analysis of Optical Property for Several Ultraviolet Thin Film Materials[J];光学学报;2003-08
9 WEI Ren xuan, JIANG De sheng (State Key Industrial Experiment Base of Fiber Optic Sensing Technology, Fiber Sensing Technology Research Center, Wuhan University of Technology, Wuhan, Hubei 430070, China);Refractive Index Measurement with Fabry-Perot Interference Wavelength[J];中国激光;2003-06
10 LIN Jian - ping (Depanrtment of Physics,Nigde Teachers College,NingdeFujian 352100,China);Measure Liguid Inder of Refraction by Interference of Cut Edge[J];宁德师专学报(自然科学版);2001-02
【Secondary References】
Chinese Journal Full-text Database 2 Hits
1 LIAO Yan-Lin;ZHAO Yan;YANG Qun;CHEN Zheng-gen;WANG Hong;Anhui University;Anhui Medical University;;Study on the Influences of Splitting Ratio on Fringe Observability of Michelson Interferometer[J];大学物理实验;2013-05
2 LI ZhihongSchool of optic-electric science and engineering,National University of Defense Technology,Changsha 410073;New Methods for Measuring Reflective Index[J];中国科技信息;2007-20
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