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《Engineering of Surveying and Mapping》 1997-01
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Obtaining Map Pattern Information

Huang W enqian Yang Qihe(Dalian Naval Academy, Dalian, 116018;Zhengzhou Institute of Surveying and Mapping , Zhengzhou, 450052)  
Image scanner and obtaining map pattern information are expounded in thispaper. According to the effect of light diffraction in scanned map film, a new trendthreshold algorithming is proposed to improve scanned program. And a subsrrtem ofobtaining map pattern information is discussed at last.
【CateGory Index】: P283
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