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《Science of Surveying and Mapping》 2013-05
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Noise test and analysis of scientific grade CCD camera Alta U9000

YUAN Yu-lei;ZHENG Yong;ZHANG Chao;Institute of Surveying and Mapping,Information Engineering University;  
In the imaging processing of CCD,some noises will be generated inevitably. These noises could influence the precision of many CCD engineering applications based on image tests. The sources and the mathematical properties of CCD noises were analyzed in the paper. And the noises of different categories of scientific grade CCD Alta U9000 were analyzed quantitatively. The changing law of the dark current noise,the imaging circuit noise and the random noise and some calculating formulas were presented then. The experiments of different exposure time to restrain the noises were made finally. It was proved that the system noises such as dark current noise and imaging circuit noise,not the random noise,could mainly be eliminated.
【Fund】: 国家自然科学基金项目(10878025)
【CateGory Index】: TN386.5
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