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《Transactions of China Electrotechnical Society》 2019-04
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A Review of Fatigue Mechanism of Power Devices Based on Physics-of-Failure

Wang Xuemei;Zhang Bo;Wu Haiping;School of Electric Power South China University of Technology;BYD Company Limited;  
Fatigue failures of the materials of power devices are accelerated because power devices always suffer continuous variations of temperature and stress in their long-term operations.Meanwhile, with the development of renewable energy technology, the demand of power density of power electronic converter is becoming higher and higher. It presents a new challenge for designing high reliability power devices. Therefore, intensive studies of fatigue failure mechanism of power devices are important to the optimizing design of packages, material selection and manufacturing technique, and also the premise of designing high reliable power devices. Physics-of-Failure(PoF) is a vital method to study the fatigue failure, which can predicate the reliability via modeling and simulating based on the analysis of the failure process and mechanism. In this review, the basic theories of fatigue failure are introduced first. Then, the fatigue mechanism and main research progress of bond wires and solder layer of power devices are introduced from the aspects of experiment, simulation,analytical model and fatigue mode. On this basis, the whole process of fatigue to failure of power devices is analyzed. Finally, from three aspects of multi-environmental stress, dynamic loading and reliability design, the research directions of power electronics reliability based on PoF are discussed.
【Fund】: 国家自然科学基金资助项目(51577074)
【CateGory Index】: TM46
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