A NEW TESTING APPROACH TO LSI/VLSI CIRCUITS
Gao Jianhua (Department of Computer Science & Engineering)
Based on testing the altering frequency of output values, a high efficient approach is presented in this paper to detect stuck-at faults on I / O linesof LSI / VLSI chips. It is interesting that the approach performed in this way works efficiently without knowing the detailed implementation of circuits under testing. The method of designing the testers is also discussed in this paper.