Full-Text Search:
Home|About CNKI|User Service|中文
Add to Favorite Get Latest Update

A NEW TESTING APPROACH TO LSI/VLSI CIRCUITS

Gao Jianhua (Department of Computer Science & Engineering)  
Based on testing the altering frequency of output values, a high efficient approach is presented in this paper to detect stuck-at faults on I / O linesof LSI / VLSI chips. It is interesting that the approach performed in this way works efficiently without knowing the detailed implementation of circuits under testing. The method of designing the testers is also discussed in this paper.
Download(CAJ format) Download(PDF format)
CAJViewer7.0 supports all the CNKI file formats; AdobeReader only supports the PDF format.
©CNKI All Rights Reserved