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Introduction to A Dynamic Efficiency Testing Device for Great Power Electronics Device

WANG Yi YUAN Hai-wen DU Ying HUANG Jian (Beihang University,Beijing 100083,China)  
A dynamic efficiency testing device for great pwoer electronics device is introduced in this article, including its operating principles,implementation and application.Based on the configuration of double CPU and double A/D conversion cell,it could be used to test the power electronics device efficiency whose conversion frequency is less than 250kHz.Some other functions such as displaying the testing results,sending data to the remote station have been implemented.Its degree of accuracy is higher than traditional instruments.
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