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《ACTA ELECTRONICA SINICA》 2000-02
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Configuration of Multiple Scan Chains in Full Scan Design

LI Zhao lin,YE Yi zheng(Microelectronics Center,Harbin Institute of Technology,P.O.B 313,Harbin 150001,China)  
Based on the overlapped test scheme this paper proposes a region configuration method of multiple scan chains.According to the given number of scan chains we can obtain optimum region of the registers in scan chain by solving the linear programming problems,and sequentially construct the multiple scan chains.For the fixed set of test vectors,test application time is reduced very much when testied by use of multiple scan chains constructed by the method.Lastly the best configuration of multiple scan chains that have minimal routing complexity can be obtained with according to the qualitative analysis of the routing complexity of multiple scan chains.
【CateGory Index】: TN791
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【Co-references】
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Chinese Journal Full-text Database 2 Hits
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