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《Acta Electronica Sinica》 2017-08
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SRAM-Based FPGA SEU Fault Propagation Model

WU Shan;ZHOU Xue-gong;WANG Ling-li;State Key Laboratory of ASIC and System,Fudan University;  
SRAM-based FPGA( Field Programmable Gate Array) could be affected by SEU( Single Event Upset) in radiation environment,causing circuit function failures. This paper proposes an SEU-induced fault propagation model for FPGAs based on the graph theory and the cellular automata. In addition,this paper divides SEU effect into two parts: SBU( Single-Bit Upset) and MBU( Multi-Bit Upset) because MBU has an extra problem about conflict management. The core part of this model is the computing method of the coupling degree which is based upon relative bits from FPGA placement and routing results to make the model more accurate. After validation between fault propagation model and fault injection experiment,this fault propagation model is 19. 89% more relative to fault injection experiment than the fault propagation model only counting relative bits in LUT( Look Up Table). Finally,this paper analyses an application about this model to find cells most easily leading to fault diffusion.
【Fund】: 国家自然科学基金(No.61131001)
【CateGory Index】: TP333
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