EBSD analyses on grain orientation and grain boundary structure of grain-oriented silicon steel
ZHOU Yi-jun,NI Xian-juan,XIA Zhao-suo,PAN Li-mei,WANG Quan-li(Department Shougang Research Institute of Technology,Beijing 100043,China)
The grain orientation and grain boundary structure of the decarburizing annealed samples of grain oriented silicon steel was investigated by electron backscatter diffraction technique in the scanning electron microscope. The results show that grain boundary mostly having a misorientation angle from 30° to 55° in the primary recrystallization and the amount of Goss grains is less than 5%. Goss grains are mainly nucleated around (111)〈112〉 grains. In addition, the orientation of final recrystallization grains was measured and the misorientation angle was calculated between the grain orientation of the finish product and (110)〈001〉.