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Indexing methods on the electron diffraction pattern of the known crystal

SHI Hong-long;LUO Min-ting;WANG Wen-zhong;School of Science,Minzu University of China;Institute of Process Engineering,Chinese Academy of Sciences;  
Electron diffraction is one of the basic structure analysis techniques,and indexing of the zone axis pattern recorded by films or CCD is a fundamental ability for the electron microscope operators. However,the pattern indexing using the traditional method should be followed by the measuring the distance between diffraction spots and the transmitted spot,calculation the d-spacing of these planes,setting { hkl} indices to them,and calculating the zone axis direction,which is obviously rather tedious and time-consuming.In this paper,we discussed all of the possible methods to improve the indexing procedure by the common used software and DM plugins.
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