EBSD characterization of primary phase in a hypoeutectic Al-Si alloy
DENG Chao;LIU Ru-xue;HONG Rui;ZHENG Jiang;College of Materials Science and Engineering,Chongqing University;
Electron backscatter diffraction technique( EBSD) was used to characterize a hypoeutectic Al-Si Alloy. The orientation data of primary α-Al phase was extracted by grain boundary map and pattern quality map. The reliable statistic results on microstructure parameters can be obtained by setting reasonable grain boundary value and band contrast value. The detailed information of content,morphology,size,distribution,and orientation,etc. can be well analyzed by the obtained results of primary α-Al phase.