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《Chinese Journal of Luminescence》 2003-01
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Reliability of High-power Semiconductor Laser Diodes

CAO Yu-lian 1, WANG Le 2, LIAO Xin-sheng 1, CHENG Dong-ming 1, LIU Yun 1, WANG Li-jun 1 (1. Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130022, China; 2. College of Electronics Science and Engineering, Jilin University, Changchun 130026, China)  
The reliability of coated and uncoated mirror facets InGaAs/GaAs and InGaAsP/GaAs high- power semiconductor lasers has been studied through aging experiment. The threshold current and output light power of the lasers were tested before aging, and it showed that the threshold current of the lasers with coated facets is decreased by a factor of 4 than that of lasers with uncoated facets. Then both kinds of lasers were tested after aging at 1.2 times of the threshold current for 40h.It showed that the threshold current was increased by more than 25mA, and output light power decreased more than 50% compared to those of without aging. So to lenghtened the lifetime of lasers, it is important that the mirrors facets must be coated.
【CateGory Index】: TN248
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【References】
Chinese Journal Full-text Database 1 Hits
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