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《Opto-electronic Engineering》 2001-01
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Laser Scanning On Line Inspection System for Ball Grid Array Coplanarity Measurement

XUE Xiao jie, SUN Chang ku, YE Sheng hua (State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072,China)  
A laser scanning on line inspection system used for BGA (Ball Grid Array ) coplanarity measurement is introduced. The dynamic errors in scanning are corrected at real time. A coplanarity evaluation method based on three point method is proposed. The corresponding experimental investigations are carried out and satisfactory results are achieved.
【Fund】: 国家自然科学基金资助项目 !(6990 60 0 1
【CateGory Index】: TN247
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【Co-citations】
Chinese Journal Full-text Database 1 Hits
1 Xue Xiaojie Ye Shenghua Sun Changku (Tianjin University);LASER VISUAL INSPECTION SYSTEM AND EVALUATING METHOD FOR GRID ARRAY DEVICE COPLANARITY[J];Chinese Journal of Mechanical Engineering;2001-05
【Co-references】
Chinese Journal Full-text Database 10 Hits
1 XI Qingkui1,2, CHEN Lei2, ZHU Rihong2, LU Runhua3, CHEN Jinbang2(1. School of Electron and Photoelectron , Nanjing Univ. of Science and Technology, Nanjing 210094, CHN;2. Information Center, Nanjing Agric University, Nanjing 210095, CHN; 3. Shanghai Cable Institute, Shanghai 200093, CHN);Fiber Measurement Based on Image Processing[J];Semiconductor Optoelectronics;2003-05
2 FENG Ya lin 1,LI Da chao 2,JIN Cui yun 2,HAO Yi long 1,JIN Shi jiu 2 (1. Institute of Microelectronics,Peking University,Beijing100871,China; 2. State Key Laboratory of Precision Measuring Technology and Instruments,Tianjin University,Tianjin300072,China);A MEMS testing system using computer microvision[J];Micronanoelectronic Technology;2003-Z1
3 MA Feng 1,CAI Xun 1,LI Gang 1,MA Hong tao 2 (1.Key Lab.of the Ministry of Education for high Temperature materials and Testing,Shnaghai Jiao Tong University,Shanghai\ 200030,China;2.State key Lab.of Tribology,Tsinghua University,Beijing\ 100084,Ch;Study on the Mechanical Properties of Diamond Like Carbon-based Functionally Gradien Film with Nanomentre Grade[J];Materials Science and Engineering;2002-02
4 TIE Chenyang BAO Jianchun XU Zheng(Coordination Chemistry Institute, State Key Laboratory of Coordination Chemistry, Nanjing University; National Laboratory of Solid State Microstructure, Nanjing University 210093);INFLUENCE OF PREPARATION CONDITIONS ON THE MAGNETIC PROPERTIES OF AN ARRAY OF METAL NANOWIRES[J];Chinese Journal of Material Research;2002-05
5 Zhang Hongna,Wang Qi (Harbin Institute of Technology, Harbin 150001, China);Image measuring technique and its applications[J];Electrical Measurement & Instrumentation;2003-07
6 Sun Jie (Hebei Polytechnic University);Application of SCM in Magnetic Powder Detector ' s Parameter Monitor[J];Electrotechnical Journal;2005-06
7 XU Zhi-wei,MA Deng-ji,LING Feng,ZHU Shan-an,HE Zheng-jun(College of Electrical Engineering,Zhejiang University,Hangzhou 310027,China);Driver Program Design for Video Decoder TVP5150 Based on DM642[J];Chinese Journal of Electron Devices;2006-03
8 CHEN Ben yong 1, ZHU Ruo gu 2, WU Zhao tong 1 (1.Department of Mechanical Engineering, Zhejiang University, Hangzhou 310027,China; 2. Department of Metrology & Measurement, China Institute of Metrology, Hangzhou 310034,China);Design of a Nano Measurement Control System Based on Dual Fabry Perot Interferometer[J];Opto-electronic Engineering;2001-01
9 FU Yan-jun, YANG Kun-tao (Department of Opto-Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China);Inspection of Inner Diameter and Inner Surface of a Steel Tube with a Technique Based on DSP[J];Opto-electronic Engineering;2003-03
10 HUANG Jie, ZHOU Zhao-fei, YU Liang-zhong (College of Manufacture, Sichuan University, Chengdu 610065, China);A precision measurement system based on linear array CCD used for hole series on curved surface[J];Opto-electronic Engineering;2003-04
China Proceedings of conference Full-text Database 1 Hits
1 Zhao Qingliang DongShen (Precision Engineering Research Institute, Harbin Institute of Technology, P.O.Box 413, 150001);STUDY ON NANO-MACHINING UTILIZING AN ATOMIC FORCE MICROSCOPE[A];[C];2000
【Secondary References】
Chinese Journal Full-text Database 1 Hits
1 ZHOU Zhao-bing ZHANG Yang Wang S (College of Wood Science and Technology,Nanjing Forestry University,Nanjing 210037,China Tennessee Forest Products Center, The University of Tennessee, Knoxville TN37996-4570, USA);Nanoindentation Testing Technique of Wood and Wood-based Composite Materials Based on AFM[J];China Forest Products Industry;2008-02
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