Full-Text Search:
Home|Journal Papers|About CNKI|User Service|FAQ|Contact Us|中文
《Opto-electronic Engineering》 2001-01
Add to Favorite Get Latest Update

Laser Scanning On Line Inspection System for Ball Grid Array Coplanarity Measurement

XUE Xiao jie, SUN Chang ku, YE Sheng hua (State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072,China)  
A laser scanning on line inspection system used for BGA (Ball Grid Array ) coplanarity measurement is introduced. The dynamic errors in scanning are corrected at real time. A coplanarity evaluation method based on three point method is proposed. The corresponding experimental investigations are carried out and satisfactory results are achieved.
【Fund】: 国家自然科学基金资助项目 !(6990 60 0 1
【CateGory Index】: TN247
Download(CAJ format) Download(PDF format)
CAJViewer7.0 supports all the CNKI file formats; AdobeReader only supports the PDF format.
【References】
Chinese Journal Full-text Database 1 Hits
1 Zheng Jinju Li Wenlong Wang Yuhui Luo Mingcheng State Key Laboratory of Digital Manufacturing Equipment & Technology, Huazhong University of Science and Technology,Wuhan,430074;QFP Chip Visual Inspection System and Its Inspection Method[J];China Mechanical Engineering;2013-03
【Co-citations】
Chinese Journal Full-text Database 1 Hits
1 Xue Xiaojie Ye Shenghua Sun Changku (Tianjin University);LASER VISUAL INSPECTION SYSTEM AND EVALUATING METHOD FOR GRID ARRAY DEVICE COPLANARITY[J];Chinese Journal of Mechanical Engineering;2001-05
【Co-references】
Chinese Journal Full-text Database 10 Hits
1 XI Qingkui1,2, CHEN Lei2, ZHU Rihong2, LU Runhua3, CHEN Jinbang2(1. School of Electron and Photoelectron , Nanjing Univ. of Science and Technology, Nanjing 210094, CHN;2. Information Center, Nanjing Agric University, Nanjing 210095, CHN; 3. Shanghai Cable Institute, Shanghai 200093, CHN);Fiber Measurement Based on Image Processing[J];Semiconductor Optoelectronics;2003-05
2 FENG Ya lin 1,LI Da chao 2,JIN Cui yun 2,HAO Yi long 1,JIN Shi jiu 2 (1. Institute of Microelectronics,Peking University,Beijing100871,China; 2. State Key Laboratory of Precision Measuring Technology and Instruments,Tianjin University,Tianjin300072,China);A MEMS testing system using computer microvision[J];Micronanoelectronic Technology;2003-Z1
3 ZHU Ji-gui,WANG Xin,WANG Da-wei,YE Sheng-hua(State Key Lab of Precision Measuring Technology and Instruments,Tianjin University,Tianjin 300072,China);Study on the Techniques of Optical Coordinate Measuring System[J];Chinese Journal of Sensors and Actuators;2007-04
4 WANG Bao-feng1,2,LI Guang-yun1,LI Zong-chun1,FAN Sheng-hong1,XU Wen-xue1(1.Institute of Surveying and Mapping,PLA Information Engineering University,Zhengzhou 450052,China;2.Beijing Aerospace Control Center,Beijing 100094,China);Application of high accuracy digital photogrammetry technology in a 50-meter large antenna[J];Engineering of Surveying and Mapping;2007-01
5 FENG Wen hao(School of Information Engineering, Wuhan University, Wuhan 430079,China);The Main Points of Elementary Techniques in Close-range Photogrammetry[J];Developments In Surveying and Mapping;2000-04
6 FENG Wen hao;Some Applications of Standard Rulers in Industrial Surveying[J];Bulletin of Surveying and Mapping;2003-03
7 Feng Wenhao(Wuhan Technical University of Surveying and Mapping, 430070);SOME ASPECTS OF DEVELOPING HIGH PRECISIONINDUSTRIAL PHOTOGRAMMETRY IN OUR COUNTRY[J];Acta Geodaetica Et Cartographic Sinica;1994-02
8 MA Feng 1,CAI Xun 1,LI Gang 1,MA Hong tao 2 (1.Key Lab.of the Ministry of Education for high Temperature materials and Testing,Shnaghai Jiao Tong University,Shanghai\ 200030,China;2.State key Lab.of Tribology,Tsinghua University,Beijing\ 100084,Ch;Study on the Mechanical Properties of Diamond Like Carbon-based Functionally Gradien Film with Nanomentre Grade[J];Materials Science and Engineering;2002-02
9 TIE Chenyang BAO Jianchun XU Zheng(Coordination Chemistry Institute, State Key Laboratory of Coordination Chemistry, Nanjing University; National Laboratory of Solid State Microstructure, Nanjing University 210093);INFLUENCE OF PREPARATION CONDITIONS ON THE MAGNETIC PROPERTIES OF AN ARRAY OF METAL NANOWIRES[J];Chinese Journal of Material Research;2002-05
10 Zhang Hongna,Wang Qi (Harbin Institute of Technology, Harbin 150001, China);Image measuring technique and its applications[J];Electrical Measurement & Instrumentation;2003-07
【Secondary References】
Chinese Journal Full-text Database 4 Hits
1 HUANG Bin-jie;LI Chao;ZENG Jian-hao;LIU Yi-jun;Guangdong University of Technology;;A Research of the Visual Detection System of Chip Quality[J];Journal of Guangdong Radio & Television University;2013-06
2 ZHOU Zhao-bing ZHANG Yang Wang S (College of Wood Science and Technology,Nanjing Forestry University,Nanjing 210037,China Tennessee Forest Products Center, The University of Tennessee, Knoxville TN37996-4570, USA);Nanoindentation Testing Technique of Wood and Wood-based Composite Materials Based on AFM[J];China Forest Products Industry;2008-02
3 Li Ming1,Wang Gang2(1.College of Sciences,Guizhou University,Guiyang 550025,China, 2.Key Laboratory of Optical Astronomy,National Astronomical Observatories,Chinese Academy of Sciences,Beijing 100012,China);Application of Photogrammetry with Separate Targets to the LAMOST[J];Astronomical Research & Technology;2011-03
4 YUAN Dan,LIU Yi,HU Yu-ming(School of Physical Electronics,University of Electronic Science and Technology of China,Chengdu 610054,China);Improvement of two-dimensional displacement measurement based on fast Fourier transform[J];Physics Experimentation;2013-04
©2006 Tsinghua Tongfang Knowledge Network Technology Co., Ltd.(Beijing)(TTKN) All rights reserved