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《Opto-Electronic Engineering》 2010-10
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The Application of Sampling Moiré Method in Material Deformation Analysis

ZHU Jiang-ping,SU Xian-yu,XIANG Li-qun ( Opto-electronic Department, Sichuan University, Chengdu 610064, China )  
Sampling Moiré method was applied to measure the material deformation accurately. Lodge grating was attached to the surface of the specimen and specimen material with its deformation together, and then different tensile deformation fringe pattern was obtained under defocus by CCD. A deformed fringe pattern was taken out. By using operations such as sampling and bilinear interpolation for the state, multi-frame phase-shifting Moiré maps were acquired. And material displacement and strain distribution were obtained with phase shift method and corresponding formulas. The basic principles of sampling Moiré method were presented, strain displacement formula was derived and experimental results were given. The results show that sampling Moiré method combined with phase-shifting technology is accessible to the material displacement and strain data only using a deformation fringe pattern, which can measure the displacement, strain and other important characteristics analysis with real-time, high accuracy and fast speed. This method is a precise measurement for deformation of the material under dynamic process.
【Fund】: 国家自然科学基金资助(60838002)
【CateGory Index】: TQ330.1
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