Full-Text Search:
Home|About CNKI|User Service|中文
Add to Favorite Get Latest Update

The High Speed Data Acquisition System for the Bit Error Rate Testing of Magneto Optical Disks

Min Min, Chen Changying (Department of Optoelectronic Engineering,Huazhong University of Science and Technology,Wuhan,430074)  
A novel high speed data acquisition temporal memory system for the bit error testing of magneto optical(MO) disks is presented in the paper.For the characters of the storage data in MO disks,the hardware consists of the independent acquisition temporal memory structure and the software consists of MCS 51 single chip computer assembly language.The data transmitting method between the system and MCS 51 single chip computer is also presented in the paper.
Download(CAJ format) Download(PDF format)
CAJViewer7.0 supports all the CNKI file formats; AdobeReader only supports the PDF format.
©CNKI All Rights Reserved