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《High Voltage Engineering》 2005-01
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Test System of Opening or Closing Simultaneity of High Voltage Switching Device

LIU Haoyu, JIN Changxing (Chengde Petroleum College, Chengde 067000, China)  
A system to test opening or closing simultaneity of hi gh voltage switching device with 12 interrupters is introduced. The system can t est closing or opening time, simultaneity and many other parameters of high volt age switch. The key part of the hardware is 8031 SCM and its software is mainly the data collecting program. The system is easy to operate and with high accurac y and test results could be directly gotten.
【CateGory Index】: TM56
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1 Zhang Hongna,Wang Qi (Harbin Institute of Technology, Harbin 150001, China);Image measuring technique and its applications[J];Electrical Measurement & Instrumentation;2003-07
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1 LIAO Minfu,ZOU Jiyan,DUAN Xiongying,ZHAO Chun(Department of Electrical and Electronics Engineering,Dalian University of Technology,Dalian 116024,China);Delay Characteristics and Design of Controller of a Field-breakdown Triggered Vacuum Switch[J];High Voltage Engineering;2006-05
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