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《Journal of Optoelectronics.Laser》 2009-01
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Determination of the optical constants and thicknesses of MEH-PPV and PFO thin films

ZHU De-xi,SHEN Wei-dong,ZHEN Hong-yu(State key laboratory of Modern Optical Instrumentation,Zhejiang University,Hangzhou 310027,China)  
We present a simple and fast method to determine the optical constant and physical thickness of two widely used-light emitting polymers,poly[2-methoxy-5-(2'-ethyl-hexyloxy)-1,4-phenylenevinylene](MEH-PPV)and poly(9,9-dioctylfluoreny-2,7-diyl)(PFO),from a single reflectivity measurement.A self-consistent dispersion formula of Forouhi-Bloomer model is introduced to fit the measured spectral curves by a modified 'Downhill' simplex algorithm.The refractive indices over the whole visible region as well as the optical band gap extracted by this method agree well with those reported in literatures.The fitted physical thicknesses present a deviation of less than 4% compared with the experimental values measured by stylus profiler.The influence of scattering loss in the fitted results is discussed to demonstrate the applicability of this technology for polymer films.
【Fund】: 国家自然科学基金资助项目(60708013);; 中国博士后基金资助项目(20070421168)
【CateGory Index】: O484.41
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【Co-references】
Chinese Journal Full-text Database 2 Hits
1 JIANG Xiuming 1,2 \ CHEN Zhichun 1\ YANG Shaoming 1\ LIN Xianfu 1 1 Department of Chemistry, Zhejiang University, Hangzhou 310027, P.R.China; 2 Department of Chemical Engineering, Zhengzhou Institute of Technology, Zhengzhou 450052, P.R.China;Progress of Fiber Optic Sensor Based on Surface Plasmon Resonance[J];Journal of Transcluction Technology;2003-01
2 Wang Bingkui;Li Yan;Shi Jingming;Lin Yafeng Physics Department, East China University of Chemical Technology, Shanghai, 200237;The Study of the Drude Parameters of Ag Film by ATR Method[J];Chinese Journal of Quantum Electronics;1993-01
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