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DEFORMATION MEASUREMENT OF CON-DUCTING POLYTHIOPHENE THIN FILMS BY AN ELECTRONIC SPECKLE PATTERN INTERFEROMETRIC METHOD

Wang Xishu~1 Zhang Jiaxin~1 Zhu Suiqun~1 Shi Gaoquan~21 Department of Engineering Mechanics,Tsinghua University,Beijing 100084,China2 Department of Chemistry,Tsinghua University,Beijing 100084,China  
The deformation measurement of electrosynthesized polythiophene(Pth)thin films is difficult because of the small thickness and high flexibility of the specimen.An electronic speckle pattern interferom- etry(ESPI)method is used to measure the deformation of Pth films of thicknesses in the range of 4-65 μm Their stress-strain curves are obtained.It is found that the mechanical properties of Pth films are sensitive to the specimen thickness.The tensile strength increases with decreasing thickness of thin film from 10 μm. The influence of the electrochemical synthesis conditions on the mechanical properties of Pth films is also dis- cussed.
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