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Characteristics of various packaged reference photovoltaic devices and their conformities to international photovoltaic standards

BIAN Jie-yu;IGARI Sanekazu;ZHOU Hong;ZHOU Jian;KOKUBO Junichi;LIU Yu-cheng;LIU Zheng-xin;University of Chinese Academy of Sciences;Research Center for New Energy Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences;Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology;  
This paper focuses on analysis of the origins of measuring transfer errors of standard solar cells and the uncertainty to international photovoltaic standards from the International Electrotechnical Commission(IEC). Six kinds of commercial packaged PV devices were chosen randomly, and their properties including temperature responsibility, spectral response and surface reflection effect were measured and evaluated based on the IEC standards, The results demonstrate that the structure of packaged PV device affects its cooling effect and temperature measurement accuracy, so that to leads to the instability of temperature and short-circuit current(Isc). The variation coefficients are 0.12% for the temperature and0.04% for the Isc. Moreover, the spectral responses with and without white bias lights all reflect the linearity feature of incident light intensity for the Isc, in which the spectral responses were quantified by defining a spectral mismatch factor. The influence of surface reflection on Isc was analyzed by measuring Isc at different incident angles, and the ΔIsc caused by the surface reflection was deduced to be up to 0.21% by fitting with a cosine function. The results provide the important guidance for the manufacture, selection and application of the packaged PV devices in photovoltaic industry.
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