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《OPTICAL TECHNOLOGY》 1999-01
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Optimization of the lamella thickness of the LLL interferometer

WANG Lin, CAO Mang, LI Dacheng (Tsinghua Univeristy, Beijing 100084)  
The key technology in realizing X ray interferometry is the fine contrast of Moire fringe and high intensity of the receiving signal. They can be influenced by many factors. This paper mainly discusses the improvement of the contrast and the signal intensity through the optimization of thickness of the three silicon lamella.
【Fund】: 自然科学基金
【CateGory Index】: TH744.3
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【Co-references】
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9 ZENG Shao qun,LU Qiang,LUO Qing ming GONG Hui,YU Jiang sheng,CHEN Ru jun (Department of Optoelectronics,Key State Laboratory for Laser Technology, Huazhong University of Science & Technology,Wuhan 430074,China);Laser Interference Pattern Processing with Wavelet Transform[J];OPTO-ELECTRONIC ENGINEERING;2000-02
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1 ;Survey on Modern Measuring Method of Distance[J];Process Automation Instrumentation;2007-11
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