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《Acta Optica Sinica》 2008-07
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Quantitative Phase Imaging System with Active Phase Stabilization Based on White-Light Interferometry

Li Xinhong Zhang Haijun Zhang Dongxian(State Key Laboratory of Modern Optical Instrumentation,Zhejiang University,Hangzhou,Zhejiang 310027,China)  
A novel self-stable quantitative phase imaging system,based on a white light Michelson interferometer with Kohler illumination is reported.An actively stabilized phase-lock circuit is employed in the system to reduce phase noise.A phase-shifting technique is used to obtain quantitative phase images of the sample.Mirror,standard negative test chart and polystyrene beads are used as samples in experiments.Clear quantitative phase images are obtained and real-time observation is realized.The system uses halogen lamp as the light source and the vertical resolution of 5 nm is obtained.The structure of Kohler illumination in the system ensures high spatial coherence.Experimental results show this system can get rid of the interfering signal from other optical surfaces,such as lens surfaces.
【Fund】: 国家863计划(2006AA04Z237);; 国家自然科学基金(50775205)资助课题
【CateGory Index】: TH74
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【References】
Chinese Journal Full-text Database 1 Hits
1 Luo Zhenyue Xue Hui Zhang Shuna Shen Weidong Gu Peifu Zhang Yueguang(State Key Laboratory of Modern Optical Instrumentation,Zhejiang University,Hangzhou,Zhejiang 310027,China);Novel Algorithm for Retrieve Thin Film Reflection Phase and Physical Thickness from White-Light Interferometry[J];Acta Optica Sinica;2010-06
【Citations】
Chinese Journal Full-text Database 4 Hits
1 Mengtao Huang Zhuangde Jiang Bing Li and Suping Fang State Key Lab for Manufacturing Systems Engineering, Institute of Precision Engineering, Xi'an Jiaotong University, Xi'an 710049 Institute of Electrical and Control Engineering, Xi'an University of Science and Technology, Xi'an 710054;Evaluation of absolute phase for 3D profile measurement using fringe projection[J];中国光学快报(英文版);2006-06
2 Lü Xiaoxu1 Zhong Liyun2 Zhang Yimo31 School of Information and Optoelectronic Science and Engineering,South China Normal University,Guangzhou 5100062 College of Life Science and Technology,Ji'nan University,Guangzhou 5106323 School of Precision Instrument and Optoelectric Engineering,Tianjin University,Tianjin 300072;A Method of Phase-Shifting Measurement by the Difference of Phase-Shifting Interferograms[J];Acta Optica Sinica;2007-04
3 Bu Peng1,2 Wang Xiangzhao1,2 Osami Sasaki3 1 Information Optics Laboratory,Shanghai Institute of Optics and Fine Mechanics, the Chinese Academy of Sciences,Shanghai 201800 2 Graduate School of the Chinese Academy of Sciences,Beijing 100039 3 Faculty of Engineering,Niigata University,Niigata-shi 950-2181,Japan;Fourier-Domain Optical Coherence Tomography Based on Sinusoidal Phase Modulation[J];Acta Optica Sinica;2007-08
4 SONG Song, WANG Xiang zhao, WANG Xue feng, QIAN Feng, CHEN Gao ting (Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800);A Laser Diode Interferometer with a Feedback Control System for Real-time Micro-vibration Measurements[J];Chinese Journal of Lasers;2002-05
【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 LIU Bin-bin,YANG Jun,YUAN Li-bo(Photonics Research Center, College of Science, Harbin Engineering University, Harbin 150001, China );Laser Interferometer Nano-vibration Measurement System Based on DPGC Technique[J];Opto-Electronic Engineering;2009-05
2 Zeng Aijun~1,2 Wang Xiangzhao1 Li Dailin1 Huang Lihua1 Dong Zuoren11 Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 2018002 Graduate School of the Chinese Academy of Sciences, Beijing 100039;A New Method to Calibrate Accurately a Photoelastic Modulator[J];Acta Optica Sinica;2005-06
3 Hu Jianming~(1,2) Zeng Aijun~1 Wang Xiangzhao~(1,2)1Shanghai Institute of Optics and Fine Mechanics,the Chinese Academy of Sciences,Shanghai 2018002 Graduate School of the Chinese Academy of Sciences,Beijing 100039;Method to Measure Phase Retardation of Wave Plate Based on Photoelastic Modulation[J];Acta Optica Sinica;2006-11
4 Xu Jiancheng Shi Qikai Chai Liqun Deng Yan Xu Qiao(Fine Optical Engineering Research Center,Chengdu,Sichuan 610041,China);Multiple-Surface Interference Fringes Analysis Based on Least-Squares Iteration[J];Acta Optica Sinica;2008-07
5 Kang Yanhui1 Zhu Jigui1 Luo Zhiyong2 Ye Shenghua1 1State Key Laboratory of Precision Measuring Technology and Instruments,Tianjin University,Tianjin 300072,China2National Institute of Metrology,Beijing 100013,China;Impact Analysis of Gaussian Beam on Measurement of Single Crystal Silicon Sphere Diameter[J];Acta Optica Sinica;2008-11
6 Xu Xingfen Cao Yiping(Department of Opto-Electronics, Sichuan University, Chengdu, Sichuan 610064, China);An Improved Stoilov Algorithm Based on Statistical Approach[J];Acta Optica Sinica;2009-03
7 HU Jian-ming~(1,2),ZENG Ai-jun~1,WANG Xiang-zhao~1~1Shanghai Institute of Optics and Fine Mechanics,The Chinese Academy of Sciences,Shanghai 201800,China~2Graduate School of the Chinese Academy of Sciences,Beijing 100039,China;New Method for Measuring Retardation of Quarter-wave Plate[J];Chinese Journal of Lasers;2006-05
8 HU Jian-ming~(1,3),ZENG Ai-jun~(1,2),WANG Xiang-zhao~1 ~1Information Optics Laboratory,Shanghai Institute of Optics and Fine Mechanics,The Chinese Academy of Sciences,Shanghai 201800,China ~2Shanghai Hengyi Optics & Fine Mechanics Co.,Ltd,Shanghai 201800,China ~3Graduate School of the Chinese Academy of Sciences,Beijing 100039,China;Polarization Modulation Technology for a Position Sensor with Grating Imaging[J];Chinese Journal of Lasers;2006-10
9 HE Guo-tian1,2,WANG Xiang-zhao1,TANG Feng11Information Optics Laboratory,Shanghai Institute of Optics and Fine Mechanics,The Chinese Academy of Sciences,Shanghai 201800,China2Graduate School of the Chinese Academy of Sciences,Beijing 100039,China;Sinusoidal Phase Modulating Interferometry Based on Low Frame Rate Area Array CCD[J];Chinese Journal of Lasers;2007-02
10 Li Zhongliang~(1,2) Wang Xiangzhao~1 Liu Yingming~1 Tang Feng~1(1 Information Optics Laboratory, Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences, Shanghai 201800, China2 Graduate University of Chinese Academy of Sciences, Beijing 100039. China);A Method to Reduce Influence of Multi-Beam Interference in Sinusoidal Phase Modulation Fizeau Interferometer[J];Chinese Journal of Lasers;2009-08
China Proceedings of conference Full-text Database 2 Hits
1 LI Wenguo 1,2 ,LV Qiujuan 1 1State Key Lab for Manufacturing Systems Engineer,Institute of Precision Engineering,Xi’an Jiaotong University,Xi’an 7100492 Institute of mechanical and electrical engineering,Kunming University of science and technology,Kunming 650093;New Phase Measurement Profilometry Using Fringe Projection[A];[C];2007
2 He Guotian~(1,2) Liao Changrong~1 Huang Shanglian~2 Song Li~4 (1 Chongqing Normal University College of Physics and Information Technology, Chongqing, 400047; 2 Chongqing University College of Optoelectronic Engineering, Chongqing, 400030; 3 Chongqing Normal University hospital, Chongqing, 400047);A Novel Vibration Measurement Method Based on the Shear Interferometry[A];[C];2008
【Co-references】
Chinese Journal Full-text Database 3 Hits
1 Shen Weidong Liu Xu Ye Hui Gu Peifu (State Key labs of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027);A New Method for Determination of the Optical Constants and Thickness of Thin Film[J];Acta Optica Sinica;2004-07
2 Xue Hui Shen Weidong Gu Peifu Luo Zhenyue Liu Xu Zhang Yueguang State Key Laboratory of Modern Optical Instrumentation , Zhejiang University, Hangzhou, Zhej iang 310027, China;Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry[J];Acta Optica Sinica;2009-07
3 Hui Xue , Weidong Shen , Peifu Gu, Zhenyue Luo , Yueguang Zhang, and Xu Liu State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China;Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry[J];中国光学快报(英文版);2009-05
【Secondary Citations】
Chinese Journal Full-text Database 7 Hits
1 Yuan Tao Xue Ping Chen Yi Chen Wei Chen Dieyan (Department of Physics, Center for Atomic and Molecular Science, Tsinghua University, Beijing 100084) (Received 5 June 1998; revised 14 September 1998);Experimental Research of Optical Coherence Tomography[J];ACTA OPTICA SINICA;1999-10
2 Song Guiju Ren Hongwu Zhang Lianying Zhang Weizai Wang Xiangzhao Fang Zujie (Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Science, Shanghai 201800);Experimental Research on Optical Coherence Tomography[J];ACTA OPTICA SINICA;2000-04
3 Wang Liwu Su Xianyu Zhou Libing (Department of Optoelectronics, Sichuan University, Chengdu 610064);Correction Algorithm of Random Phase Shifting Errors in Phase Measuring Profilometry[J];Acta Optica Sinica;2004-05
4 Shao Shuangyun 1,2 Su Xiangyu 1 Wang Hua 1 Li Zheren 3 1 Optoelectronics Department, Sichuan University, Chengdu 610064 2 School of Science, Beijing Jiaotong University, Beijing 100044 3 Institute of Fluid Physics, The Chinese Academy of Engineering Physics, Mianyang 621900;Calibration of the Measurement System Based on Modulation Measurement Profilometry[J];Acta Optica Sinica;2005-02
5 Yu Xiaofeng Ding Zhihua Chen Yuheng Huang Lina Zhou LinZhou Zhenming Wu Lan Liu Xu(State Key Lab of Modern Optical Instrumentation,Zhejiang University, Hangzhou 310027);Development of Fiber-Based Optical Coherence Tomographic Imaging System[J];Acta Optica Sinica;2006-02
6 Lu Xiaoxu~1 Zhong Liyun~2 Zhang Yimo~31 School for Information and Optoelectronics Science and Engineering,South China Normal University, Guangzhou 5106312 College of Life Science and Technology,Ji'nan University,Guangzhou 5106323 School of Precision Instrument and Optoelectronics Engineering,Tianjin University,Tianjin 300072;Holographic Reconstructing Algorithm and Its Error Analysis about Phase-Shifting Phase Measurement[J];Acta Optica Sinica;2006-09
7 LUO Yin-long~1, L Xiao-xu~1, ZHU Yue~1, ZHONG Li-yun~2()~1School for Information and Optoelectronic Science and Engineering,South China Normal University, Guangzhou, Guangdong 510631, China()~2College of Life Science and Technology, Jinan University, Guangzhou, Guangdong 510632, China;Real-Time High Accuracy Phase-Shifting Calibrating Method Based on One-Dimensional Spatial Digital Correlation[J];Chinese Journal of Lasers;2005-08
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