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《Acta Optica Sinica》 2008-07
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Noise Analysis of HgCdTe Photoconductive Detector with Different Response Wavelength

Zhang Yan Fang Jiaxiong(State Key Laboratory of Transducer Technology,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China)  
The influence of background radiation on noise of medium-wave and extremely-long-wave HgCdTe detectors is studied.It is found that the noise of extremely-long-wave detector decreases with the background radiation increasing,while for the medium-wave detector is shows the different way.Noise spectra show that the main noise sources are generation-recombination(G-R) noise and 1/f noise which have the similar trend while the background is changing.The G-R noise for different wavelength response detectors is calculated using carriers and effective lifetime theory.There exists a maximum value when G-R noise changes with background radiation.While the noise is on the different position for medium-wave and extremely-long-wave detectors,the influence of background radiation on their effective lifetime is different.So noise behaves differently.Based on these,a new concept of "critical-background-radiation-flux-density" is put forward.
【CateGory Index】: TN252
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