Wavelet Ridge Extraction Method Employing a Cost Function in Two-Dimensional Wavelet Transform Profilometry
Xu Dongying;Li Sikun;Wang Xiangzhao;Wang Kaiwei;Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences;College of Optical Science and Engineering, Zhejiang University;University of Chinese Academy of Sciences;
Wavelet ridge extraction is a key step in the wavelet transform profilometry. The speed and noise suppression capability of the wavelet ridge extraction method directly influences the wavelet transform profilometry.One new wavelet ridge extraction method used in the two-dimensional wavelet transform profilometry is proposed based on a new evaluation function. This function is established by using the module information from the wavelet transform coefficients, fringe instantaneous frequency and local fringe direction to improve the noise suppression capability. Moreover, one fast dynamic optimization algorithm is adopted to improve the wavelet ridge extraction speed. Computer simulation and experimental demonstration verify the proposed method's effectiveness.